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Number of items: 190.

2026

Aves, Roanne Deanne, El-Maiss, Janwa, Balakrishnan, Divya, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Abrantes, Mafalda, Borme, Jérôme, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Alpuim, Pedro and García, César Pascual(2026)A graphene field-effect transistor-based biosensor platform for the electrochemical profiling of amino acids. Biosensors, 16(2), 83. (doi: 10.3390/bios16020083)

Gao, Yingjia, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Williams, Ross, Shvarts, Andrei ORCID: https://orcid.org/0000-0002-7607-7472, Kaczmarczyk, Lukasz ORCID: https://orcid.org/0000-0002-8468-5435 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2026)Mixed finite element method for device simulations. Solid-State Electronics, (doi: 10.1016/j.sse.2026.109346) (Early Online Publication)

2025

Dixit, Ankit ORCID logo ORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Sandeep, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Patil, Deven H., Dasgupta, S., Bagga, Navjeet, Aguinsky, Luiz Felipe ORCID: https://orcid.org/0000-0003-4722-0636 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Assessing the impact of process and design variations on reliability of complementary FET. Solid-State Electronics, 230, 109226. (doi: 10.1016/j.sse.2025.109226)

Ansari, Md. Hasan Raza, Alqahtani, Bashayr, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and El-Atab, Nazek(2025)Energy-efficient logic-in-memory and neuromorphic computing in RSD MOSFETs. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, (doi: 10.1109/JXCDC.2025.3630217) (Early Online Publication)

Acharya, Pranav ORCID logo ORCID: https://orcid.org/0000-0002-4701-5037, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Sensitivity of resonant tunneling diodes to barrier variation and quantum well variation: a NEGF study. Micro and Nanostructures, 207, 208264. (doi: 10.1016/j.micrna.2025.208264)

Dixit, Ankit ORCID logo ORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logo ORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Mobility and intrinsic performance of silicon-based nanosheet FETs at 3 nm CMOS and beyond. Solid-State Electronics, 229, 109172. (doi: 10.1016/j.sse.2025.109172)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit, Kumar, Prateek, Ansari, Md. Hasan Raza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, Cesar Pascual and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Optimizing peptide detection using FET-based sensors: integrating non-linearities of surface functionalization. Solid-State Electronics, 229, 109161. (doi: 10.1016/j.sse.2025.109161)

Kumar, Prateek, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Ansari, Hasan Raaza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, César Pascual and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics. Solid-State Electronics, 229, 109159. (doi: 10.1016/j.sse.2025.109159)

Imroze, Fiheon ORCID logo ORCID: https://orcid.org/0000-0002-5199-8873, Yalagala, Bhavani, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Elsayed, Mostafa, Ahmad, Meraj, Graham, Robert ORCID: https://orcid.org/0000-0001-8520-4587, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Heidari, Hadi ORCID logo ORCID: https://orcid.org/0000-0001-8412-8164 and Weides, Martin ORCID: https://orcid.org/0000-0002-2718-6795(2025)Cryogenic neuromorphic synaptic behaviour using 180 nm silicon MOSFETs for emerging computing systems. Advanced Intelligent Systems, (doi: 10.1002/aisy.202500506) (Early Online Publication)

Imroze, Fiheon ORCID logo ORCID: https://orcid.org/0000-0002-5199-8873, Tang, Xiahui, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Heidari, Hadi ORCID: https://orcid.org/0000-0001-8412-8164 and Weides, Martin ORCID logo ORCID: https://orcid.org/0000-0002-2718-6795(2025)Impact of Dielectric Material and BOX Thickness on Self-Heating in FDSOI Transistors. In: XXIII International Workshop on the Physics of Semiconductor Devices 2025, Uttarakhand, India, 15-18 Dec 2025, (Accepted for Publication)

Acharya, Pranav ORCID logo ORCID: https://orcid.org/0000-0002-4701-5037 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Interface roughness in Resonant Tunnelling Diodes for physically unclonable functions. Solid-State Electronics, 228, 109131. (doi: 10.1016/j.sse.2025.109131)

Dixit, Ankit ORCID logo ORCID: https://orcid.org/0000-0002-6653-6460, Ghosh, Ramesh ORCID: https://orcid.org/0000-0001-9586-8061, JACOBS, JAKE, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Vila-Nadal, Laia ORCID: https://orcid.org/0000-0002-7718-7227, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366, Paul, Douglas J. ORCID logo ORCID: https://orcid.org/0000-0001-7402-8530 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Nanowire behavior under the influence of polyoxometalates: a comparative study of depletion and enhancement modes. Solid-State Electronics, 228, 109145. (doi: 10.1016/j.sse.2025.109145)

Smoliak, Nicholas, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Parreira, Pedro Miguel ORCID: https://orcid.org/0000-0003-4527-012X, Macdonald, Craig ORCID: https://orcid.org/0000-0003-3143-279X and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)A hybrid analytical and machine learning model of BioFETs for the detection of peptides. IEEE Sensors Letters, 9(10), 4502604. (doi: 10.1109/LSENS.2025.3606612)

Smoliak, Nicholas, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Parreira, Pedro ORCID: https://orcid.org/0000-0003-4527-012X, Macdonald, Craig ORCID: https://orcid.org/0000-0003-3143-279X and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)A Hybrid Analytical and Machine Learning Model of BioFETs for the Detection of Peptides. SAL-DC Summit 2025, Leoben, Austria, 24-26 Sep 2025.

Smoliak, Nicholas, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Parreira, Pedro ORCID: https://orcid.org/0000-0003-4527-012X, Macdonald, Craig ORCID: https://orcid.org/0000-0003-3143-279X and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)A Hybrid Analytical and Machine Learning Model of BioFETs for the Detection of Peptides. UK AI Research Symposium (UKAIRS 2025), Northumbria University, Newcastle, UK, 08-09 Sep 2025.

Smoliak, Nicholas, Parreira, Pedro ORCID logo ORCID: https://orcid.org/0000-0003-4527-012X, Macdonald, Craig ORCID: https://orcid.org/0000-0003-3143-279X and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Modelling Framework for Solid-Phase Peptide Synthesis on SiO2. 1st International Conference on Responsible Electronics and Circular Technologies (REACT 2025), Glasgow, UK, 11-12 Nov 2025.

Imroze, Fiheon ORCID logo ORCID: https://orcid.org/0000-0002-5199-8873, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Adamu-Lema, Fikru, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Heidari, Hadi ORCID: https://orcid.org/0000-0001-8412-8164 and Weides, Martin ORCID: https://orcid.org/0000-0002-2718-6795(2025)Linear variation of threshold voltage with back bias for 22nm FDSOI at cryogenic temperature. In: 2025 Device Research Conference (DRC), Durham, NC, USA, 22-25 June 2025, ISBN 9798350392838(doi: 10.1109/drc66027.2025.11105733)

Park, Yongjin, Lim, Eunjin, Lee, Seungjun, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Kim, Sungjoon and Kim, Sungjun(2025)Ferroelectric memristor crossbar arrays for highly integrated neuromorphic computing system. Nano Energy, 141, 111137. (doi: 10.1016/j.nanoen.2025.111137)

Patel, Jyoti, Satwik, Bathula, Bagga, Navjeet, Bais, Ishani, Arora, Chirag, Kumar, Vivek, Dixit, Ankit ORCID logo ORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Dasgupta, S.(2025)Machine learning augmented TCAD assessment of corner radii in nanosheet FET. Solid-State Electronics, 227, 109114. (doi: 10.1016/j.sse.2025.109114)

Acharya, Pranav ORCID logo ORCID: https://orcid.org/0000-0002-4701-5037, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Lee, Jaehyun and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Impact of interface roughness correlation on resonant tunnelling diode variation. Scientific Reports, 15(1), 26815. (doi: 10.1038/s41598-025-07720-0) (PMID:40702025) (PMCID:PMC12287518)

Xue, Liyuan ORCID logo ORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2025)Generative process variation modeling and analysis for advanced technology based on variational autoencoder. IEEE Transactions on Electron Devices, 72(7), 3889 -3895. (doi: 10.1109/TED.2025.3570675)

Iadanza, S., Rihani, M., Martinez, C.O., Scherrer, M.A., Georgiev, V. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Schmid, H. and Moselund, K.E.(2025)Ultra-Low Temperature Characterization of Fully-Integrated III-V Photodetectors for Quantum Networks. In: 2024 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 07-11 December 2024, pp. 1-4. ISBN 9798350365436(doi: 10.1109/iedm50854.2024.10873440)

2024

Acharya, Pranav ORCID logo ORCID: https://orcid.org/0000-0002-4701-5037, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Sengupta, Amretashis ORCID: https://orcid.org/0000-0003-1125-6389, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Maciazek, Patryk, Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Analysis of random discrete dopants embedded nanowire resonant tunnelling diodes for generation of physically unclonable functions. IEEE Transactions on Nanotechnology, (doi: 10.1109/TNANO.2024.3504963) (Early Online Publication)

Aleksandrov, Preslav, Acharya, Pranav ORCID logo ORCID: https://orcid.org/0000-0002-4701-5037 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Diffusion-Based Machine Learning Method for Accelerating Quantum Transport Simulations in Nanowire Transistors. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 Sep 2024, ISBN 9798331516352(doi: 10.1109/sispad62626.2024.10733041)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet(2024)Revealing the Noise Dependent Sensitivity of a Junctionless FinFET-Based Hydrogen Sensor with Ferroelectric Gate Stack. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352(doi: 10.1109/SISPAD62626.2024.10733257)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Understanding the dynamic perturbative behaviour of Electrolyte-Gated FET Based Biosensors with Immobilised Nanoparticles. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352(doi: 10.1109/SISPAD62626.2024.10733212)

Xue, Liyuan ORCID logo ORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Liu, Bo ORCID: https://orcid.org/0000-0002-3093-4571(2024)Machine learning-assisted device circuit co-optimization: A case study on inverter. IEEE Transactions on Electron Devices, 71(12), pp. 7256-7262. (doi: 10.1109/TED.2024.3476231)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Xeni, Nikolas, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Topaloglu, Ismail ORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366(2024)Predictive Simulation of Nanosheet Transistors including the Impact of Access Resistance. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 25-27 Sept 2024, ISBN 9798331516352(doi: 10.1109/SISPAD62626.2024.10733048)

Dixit, Ankit ORCID logo ORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logo ORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Unravelling the Impact of Random Dopant Fluctuations on Si-Based 3nm NSFET: A NEGF Analysis. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 5-8. ISBN 9798350386240(doi: 10.1109/NANO61778.2024.10628880)

Jacobs, Jake, Vila-Nadal, Laia ORCID logo ORCID: https://orcid.org/0000-0002-7718-7227 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Atomistic modeling of [W18O54(SeO3)2]4- polyoxometalates (POM) molecules in the presence of counter-cations. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 141-145. ISBN 9798350386240(doi: 10.1109/NANO61778.2024.10628858)

Martinez-Oliver, Cristina, Scherrer, Markus, Iadanza, Simone, Schmid, Heinz, Moselund, Kirsten and Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2024)Simulation and fabrication of monolithic III-V photodetectors on Si: the role of growth facets and localization of heterojunctions. IEEE Transactions on Electron Devices, (doi: 10.1109/TED.2024.3437333) (Early Online Publication)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Aleksandrov, Preslav ORCID: https://orcid.org/0009-0009-5198-9983, Gao, Yingjia, Macdonald, Craig ORCID: https://orcid.org/0000-0003-3143-279X, García, César Pascual and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Combinations of analytical and machine learning methods in a single simulation framework for amphoteric molecules detection. IEEE Sensors Letters, 8(7), 1501004. (doi: 10.1109/LSENS.2024.3408101)

Liu, Tongfei, Rezaei, Ali ORCID logo ORCID: https://orcid.org/0000-0001-9150-9520, Yang, Kaige, Fan, Xuge, Acharya, Pranav ORCID: https://orcid.org/0000-0002-4701-5037, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Ding, Jie(2024)The study of electron mobility on ultra-scaled silicon nanosheet FET. Physica Scripta, 99(7), 075410. (doi: 10.1088/1402-4896/ad56d9)

Kumar, Prateek, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Steep-subthreshold bilayer tunnel field effect transistor based efficient pH sensing: performance characterisation and optimization. IEEE Sensors Letters, (doi: 10.1109/LSENS.2024.3419581) (Early Online Publication)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet(2024)Sensitivity and Reliability Assessment of a Strained Silicon Junctionless FinFET-based Hydrogen Gas Sensor. In: 2024 IEEE Latin American Electron Devices Conference (LAEDC), Guatemala City, Guatemala, 08-10 May 2024, ISBN 9798350361292(doi: 10.1109/laedc61552.2024.10555835)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam, El Maiss, Janwa, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and García, César Pascual(2024)Discovery of amphoteric fingerprints of amino acids with field-effect transistors. IEEE Access, (doi: 10.1109/ACCESS.2024.3411168) (Early Online Publication)

Kumar, Prateek, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Low-voltage feedback field effect transistor based ion-sensing: a novel and detailed investigation for energy-efficient pH sensor. IEEE Sensors Letters, 8(6), 2000604. (doi: 10.1109/LSENS.2024.3403052)

Shashank, Mishra, Liu, Fengyuan, Shakthivel, Dhayalan, Rai, Beena and Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2024)Molecular dynamics simulation based study to analyse the properties of entrapped water between gold and graphene 2D interface. Nanoscale Advances, 6(9), pp. 2371-2379. (doi: 10.1039/D3NA00878A) (PMID:38694470) (PMCID:PMC11059550)

Shukla, R. P. et al. (2024)Rational design of a planar junctionless field-effect transistor for sensing biomolecular interactions. Proceedings, 97(1), 121. (doi: 10.3390/proceedings2024097121)

Brugnolotto, Enrico, Aleksandrov, Preslav ORCID logo ORCID: https://orcid.org/0009-0009-5198-9983, Sousa, Marilyne and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Machine learning inspired nanowire classification method based on nanowire array scanning electron microscope images. Open Research Europe, 4, 43. (doi: 10.12688/openreseurope.16696.1)

Mishra, Shashank ORCID logo ORCID: https://orcid.org/0000-0002-0538-7174, Nair, Nitheesh M. ORCID: https://orcid.org/0000-0003-2249-6863, Khandelwal, Gaurav ORCID: https://orcid.org/0000-0002-7698-4494, Rai, Beena and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2024)Capacitive-triboelectric based hybrid sensor system for human-like tactile perception. IEEE Sensors Letters, 8(2), 5500404. (doi: 10.1109/LSENS.2024.3351692)

2023

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Pascual García, César and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Insights into the Ultra-Steep Subthreshold Slope Gate-all-around Feedback-FET for Memory and Sensing Applications. In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC), Paestum, Italy, 22-25 October 2023, pp. 617-620. ISBN 9798350335460(doi: 10.1109/nmdc57951.2023.10343913)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Pascual García, César, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Charge dynamics of amino acids fingerprints and the effect of density on FinFET-based electrolyte-gated sensor. Solid-State Electronics, 210, 108789. (doi: 10.1016/j.sse.2023.108789)

Gandhi, Navneet, Jaisawal, Rajeewa Kumar, Rathore, Sunil, Kondekar, P. N., Dixit, Ankit ORCID logo ORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet(2023)Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. In: 2023 IEEE SENSORS, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872(doi: 10.1109/SENSORS56945.2023.10324885)

Mishra, Shashank ORCID logo ORCID: https://orcid.org/0000-0002-0538-7174, John, Dina Anna, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Rai, Beena and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Human-Inspired Stretch and Joint-Bend Sensing System Based on Flexible Sensors. In: IEEE Sensors 2023, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872(doi: 10.1109/SENSORS56945.2023.10325250)

Aleksandrov, Preslav ORCID logo ORCID: https://orcid.org/0009-0009-5198-9983, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Fully Convolutional Generative Machine Learning Method for Accelerating Non-Equilibrium Green’s Function Simulations. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 169-172. ISBN 9784863488038(doi: 10.23919/SISPAD57422.2023.10319587)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Electrolyte-Gated FET-based Sensing of Immobilized Amphoteric Molecules Including the Variability in Affinity of the Reactive Sites. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 377-380. ISBN 9784863488038(doi: 10.23919/SISPAD57422.2023.10319578)

Li, Weihao, Wolff, Niklas, Samuel, Arun Kumar, Wang, Yuanshen, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Kienle, Lorenz and Ganin, Alexey ORCID: https://orcid.org/0000-0002-3754-5819(2023)Unlocking high-performance supercapacitor behavior and sustained chemical stability of 2D metallic CrSe2 by optimal electrolyte selection. ChemElectroChem, 10(21), e202300428. (doi: 10.1002/celc.202300428)

Brugnolotto, Enrico, Schmid, Heinz, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Sousa, Marilyne(2023)In-plane III-V nanowires on Si (1 1 0) with quantum wells by selective epitaxy in templates. Crystal Growth and Design, 23(11), pp. 8034-8042. (doi: 10.1021/acs.cgd.3c00806)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Novel Detection Methodology of Milk-Oligopeptides Fingerprints using Ion-Sensitive BioFET. In: 2023 IEEE BioSensors Conference (BioSensors), London, UK, 30 July - 1 August 2023, ISBN 9798350346046(doi: 10.1109/BioSensors58001.2023.10281172)

Aleksandrov, Preslav ORCID logo ORCID: https://orcid.org/0009-0009-5198-9983, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Xeni, Nikolas, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Convolutional machine learning method for accelerating non-equilibrium Green’s function simulations in nanosheet transistor. IEEE Transactions on Electron Devices, 70(10), pp. 5448-5453. (doi: 10.1109/TED.2023.3306319)

Dam Vedel, Christian, Gunst, Tue, Smidstrup, Søren and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2023)Shockley-Read-Hall recombination and trap levels in In 0.53Ga 0.47As point defects from first principles. Physical Review B, 108, 094113. (doi: 10.1103/PhysRevB.108.094113)

Medina Bailon, Cristina, Nedjalkov, Mihail, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2023)Comprehensive mobility study of silicon nanowire transistors using multi-subband models. Nano Express, 4, 025005. (doi: 10.1088/2632-959X/acdb8a)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, Pascual Garcia, Cesar and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)A novel computational framework for simulations of bio-field effect transistors. ECS Transactions, 111(1), pp. 249-260. (doi: 10.1149/11101.0249ecst)

Brugnolotto, Enrico, Scherrer, Markus, Schmid, Heinz, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Sousa, Marilyne(2023)Growth of type I superlattice III-V heterostructure in horizontal nanowires enclosed in a silicon oxide template. Journal of Crystal Growth, 603, 127015. (doi: 10.1016/j.jcrysgro.2022.127015)

Dhar, Rakshita, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Garcia, Cesar Pascual and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2023)Deriving a novel methodology for nano-BioFETs and analysing the effect of high-k oxides on the amino-acids sensing application. Solid-State Electronics, 200, 108525. (doi: 10.1016/j.sse.2022.108525)

Nagy, Daniel ORCID logo ORCID: https://orcid.org/0000-0003-0854-6596, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Topaloglu, Ismail ORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366(2023)Hierarchical simulation of nanosheet field effect transistor: NESS flow. Solid-State Electronics, 199, 108489. (doi: 10.1016/j.sse.2022.108489)

2022

Dam Vedel, Christian, Smidstrup, Søren and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2022)First-principles investigation of polytypic defects in InP. Scientific Reports, 12, 19724. (doi: 10.1038/s41598-022-24239-w) (PMID:36385159) (PMCID:PMC9669039)

Guan, Yunhe, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366, Liang, Feng and Chen, Haifeng(2022)Impact of the Figures of Merit (FoMs) definitions on the variability in nanowire TFET: NEGF simulation study. IEEE Transactions on Electron Devices, 69(11), pp. 6394-6399. (doi: 10.1109/TED.2022.3204596)

Lapham, Paul and Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2022)Theoretically probing the relationship between barrier length and resistance in Al/AlOx/Al tunnel junctions. Solid-State Electronics, 197, 108442. (doi: 10.1016/j.sse.2022.108442)

Dhar, Rakshita, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Pascual Garcia, Cesar and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2022)Assessing the effect of scaling high-aspect-ratio ISFET with physical model interface for nano-biosensing application. Solid-State Electronics, 195, 108374. (doi: 10.1016/j.sse.2022.108374)

Gauhar, Ghulam Ali, Chenchety, Abhishek, Yenugula, Hashish, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Badami, Oves(2022)Study of gate current in advanced MOS architectures. Solid-State Electronics, 194, 108345. (doi: 10.1016/j.sse.2022.108345)

Rezaei, Ali ORCID logo ORCID: https://orcid.org/0000-0001-9150-9520, Maciazek, Patryk, Sengupta, Amretashis ORCID: https://orcid.org/0000-0003-1125-6389, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Medina-Bailon, Cristina, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2022)Statistical device simulations of III-V nanowire resonant tunneling diodes as physical unclonable functions source. Solid-State Electronics, 194, 108339. (doi: 10.1016/j.sse.2022.108339)

Shukla, Rajendra P., Bomer, J. G., Wijnperle, Daniel, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508, Singh, Aruna Chandra, Krishnamoorthy, Sivashankar, García, César Pascual, Pud, Sergii and Olthuis, Wouter(2022)Planar junctionless field-effect transistor for detecting biomolecular interactions. Sensors, 22(15), 5783. (doi: 10.3390/s22155783)

Tok, Kean H., Mehedi, Mehzabeen, Zhang, Jian F., Brown, James, Ye, Zengliang, Ji, Zhigang, Zhang, Weidong, Marsland, John S., Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2022)An integral methodology for predicting long-term RTN. IEEE Transactions on Electron Devices, 69(7), pp. 3869-3875. (doi: 10.1109/TED.2022.3176585)

Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, García, César Pascual and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2022)Discovery of Amino Acid fingerprints transducing their amphoteric signatures by field-effect transistors. ChemRxiv, (doi: 10.26434/chemrxiv-2022-bm062-v2)

Lapham, Paul and Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2022)Computational study of oxide stoichiometry and variability in the Al/AlOx/Al tunnel junction. Nanotechnology, 33(26), 265201. (doi: 10.1088/1361-6528/ac5f2e) (PMID:35303731)

Chen, R. et al. (2022)Carbon nanotube SRAM in 5-nm technology node design, optimization, and performance evaluation--part I: CNFET transistor optimization. IEEE Transactions on Very Large Scale Integration Systems, 30(4), pp. 432-439. (doi: 10.1109/TVLSI.2022.3146125)

Chen, R. et al. (2022)Carbon nanotube SRAM in 5-nm technology node design, optimization, and performance evaluation--part II: CNT interconnect optimization. IEEE Transactions on Very Large Scale Integration Systems, 30(4), pp. 440-448. (doi: 10.1109/TVLSI.2022.3146064)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Medina Bailon, Cristina, Xeni, Nikolas, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2022)Density Gradient Based Quantum-Corrected 3D Drift-Diffusion Simulator for Nanoscale MOSFETs. In: 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC), Vancouver, Canada, 12-15 Dec 2021, ISBN 9781665418928(doi: 10.1109/NMDC50713.2021.9677480)

2021

Dhar, Rakshita Pritam Singh, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Medina-Bailon, Cristina, Garcia, Cesar Pascual and Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508(2021)TCAD Simulations of High-Aspect-Ratio Nano-biosensor for Label-Free Sensing Application. In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Caen, France, 1-3 Sep 2021, ISBN 9781665437455(doi: 10.1109/EuroSOI-ULIS53016.2021.9560701)

Vedel, Christian Dam, Brugnolotto, Enrico, Smidstrup, Soren and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2021)Impact of Different Types of Planar Defects on Current Transport in Indium Phosphide (InP). In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Caen, France, 1-3 Sep 2021, ISBN 9781665437455(doi: 10.1109/EuroSOI-ULIS53016.2021.9560698)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2021)Stability and Vmin analysis of ferroelectric negative capacitance FinFET based SRAM in the presence of variability. Solid-State Electronics, 184, 108100. (doi: 10.1016/j.sse.2021.108100)

Martinez-Oliver, Cristina, Moselund, Kirsten E. and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2021)Evaluation of Material Profiles for III-V Nanowire Photodetectors. In: 2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), 13-17 Sep 2021, pp. 39-40. ISBN 9781665412766(doi: 10.1109/NUSOD52207.2021.9541533)

Medina-Bailon, Cristina, Kumar, Naveen ORCID logo ORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, Todorova, Ilina, Lenoble, Damien, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508 and Pascual García, César(2021)Comprehensive analytical modelling of an absolute pH sensor. Sensors, 21(15), 5190. (doi: 10.3390/s21155190)

Medina-Bailon, Cristina, Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2021)Simulation and modeling of novel electronic device architectures with NESS (Nano-Electronic Simulation Software): a modular nano TCAD simulation framework. Micromachines, 12(6), 680. (doi: 10.3390/mi12060680)

Medina-Bailon, Cristina, Padilla, José Luis, Sampedro, Carlos, Donetti, Luca, Gergiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2021)Self-consistent enhanced S/D tunneling implementation in a 2D MS-EMC nanodevice simulator. Micromachines, 12(6), 601. (doi: 10.3390/mi12060601)

Guan, Yunhe, Carrillo-Nuñez, Hamilton, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366, Liang, Feng, Li, Zunchao and Chen, Haifeng(2021)Quantum simulation investigation of work-function variation in nanowire tunnel FETs. Nanotechnology, 32(15), 150001. (doi: 10.1088/1361-6528/abd125) (PMID:33285530)

Lapham, Paul, Vilà-Nadal, Laia ORCID logo ORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Leroy ORCID: https://orcid.org/0000-0001-8035-5757 and Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508(2021)Influence of the contact geometry and counterions on the current flow and charge transfer in polyoxometalate molecular junctions: a density functional theory study. Journal of Physical Chemistry C, 125(6), pp. 3599-3610. (doi: 10.1021/acs.jpcc.0c11038) (PMID:33633816) (PMCID:PMC7899180)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Medina Bailon, Cristina, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Xeni, Nikolas, Abourrig, Yassine, Kumar, Naveen ORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2021)TCAD Simulation of Novel Semiconductor Devices. In: International Conference on ASIC (ASICON) 2021, Kunming, China, 26-29 October 2021, ISBN 9781665438674(doi: 10.1109/ASICON52560.2021.9620465)

2020

Medina-Bailon, Cristina, Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Rezaei, Ali ORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)Nano-electronic simulation software (NESS): a novel open-source TCAD simulation environment. Journal of Microelectronic Manufacturing, 3(4), 20030407. (doi: 10.33079/jomm.20030407)

Georgiev, V.P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Sengupta, A. ORCID: https://orcid.org/0000-0003-1125-6389, Maciazek, P., Badami, O., Medina-Bailon, C., Dutta, T. ORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, F. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2020)Simulation of Gated GaAs-AlGaAs Resonant Tunneling Diodes for Tunable Terahertz Communication Applications. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 241-244. ISBN 9784863487635(doi: 10.23919/SISPAD49475.2020.9241677)

Lapham, P., Badami, Ov., Medina-Bailon, C., Adamu-Lema, F., Dutta, T. ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Nagy, D. ORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, V. ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2020)A Combined First Principles and Kinetic Monte Carlo study of Polyoxometalate based Molecular Memory Devices. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 273-276. ISBN 9784863487635(doi: 10.23919/SISPAD49475.2020.9241606)

McGhee, Joseph and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2020)First Principle Simulations of Electronic and Optical Properties of a Hydrogen Terminated Diamond Doped by a Molybdenum Oxide Molecule. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 31-34. ISBN 9784863487635(doi: 10.23919/SISPAD49475.2020.9241630)

Medina Bailon, Cristina, Badami, Oves, Carrillo-Nunez, Hamilton, Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Nagy, Daniel ORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)Enhanced Capabilities of the Nano-Electronic Simulation Software (NESS). In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 293-296. ISBN 9781728173542(doi: 10.23919/SISPAD49475.2020.9241594)

McGhee, Joseph and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2020)Electronic and Optical Properties of Hydrogen-Terminated Diamond Doped by Molybdenum Oxide: A Density Functional Theory Study. In: 2020 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), Turin, Italy, 14-18 Sep 2020, ISBN 9781728160863(doi: 10.1109/NUSOD49422.2020.9217662)

Xeni, Nikolas, Ghannam, Rami ORCID logo ORCID: https://orcid.org/0000-0001-6910-9280, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru, Badami, Oves and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)The Use of TCAD Simulations in Semiconductor Devices Teaching. Transnational Engineering Education Using Technology Workshop (TREET 2020), Glasgow, UK, 31 Jul 2020. ISBN 9781728188515(doi: 10.1109/TREET50959.2020.9189752)

Berrada, Salim, Carrillo-Nunez, Hamilton, Lee, Jaehyun, Medina Bailon, Cristina, Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Badami, Oves, Adamu-Lema, Fikru, Thirunavukkarasu, Vasanthan, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)Nano-electronic Simulation Software (NESS): a flexible nano-device simulation platform. Journal of Computational Electronics, 19, pp. 1031-1046. (doi: 10.1007/s10825-020-01519-0)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)Vmin Prediction for Negative Capacitance MOSFET based SRAM. In: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 01-30 Sep 2020, ISBN 9781728187655(doi: 10.1109/EUROSOI-ULIS49407.2020.9365282)

Badami, Oves, Sadi, Toufik, Adamu-Lema, Fikru, Lapham, Paul, Mu, Dejiang, Nagy, Daniel ORCID logo ORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Ding, Jie and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)A Kinetic Monte Carlo study of retention time in a POM molecule-based flash memory. IEEE Transactions on Nanotechnology, 19, pp. 704-710. (doi: 10.1109/TNANO.2020.3016182)

Carrillo-Nuñez, Hamilton, Medina-Bailón, Cristina, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)Full-band quantum transport simulation in presence of hole-phonon interactions using a mode-space k·p approach. Nanotechnology, 32(2), 020001. (doi: 10.1088/1361-6528/abacf3) (PMID:32759487)

Adamu-Lema, F., Monzio Compagnoni, C., Badami, O., Georgiev, V. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2020)RTN and its intrinsic interaction with statistical variability sources in advanced nano-scale devices: a simulation study. In: Grasser, Tibor (ed.)Noise in Nanoscale Semiconductor Devices. Springer: Cham, pp. 441-466. ISBN 9783030374990(doi: 10.1007/978-3-030-37500-3_13)

McGhee, Joseph and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2020)Simulation study of surface transfer doping of hydrogenated diamond by MoO₃ and V₂O₅ metal oxides. Micromachines, 11(4), 433. (doi: 10.3390/mi11040433)

Medina-Bailon, Christina, Carrillo-Nunez, Hamilton, Lee, Jaehyun, Sampedro, Carlos, Padilla, Jose Luis, Donetti, Luca, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2020)Quantum enhancement of a S/D tunneling model in a 2D MS-EMC nanodevice simulator: NEGF comparison and impact of effective mass variation. Micromachines, 11(2), 204. (doi: 10.3390/mi11020204)

2019

Xeni, Nikolas, Ghannam, Rami ORCID logo ORCID: https://orcid.org/0000-0001-6910-9280, Udama, Fikru, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Semiconductor Device Visualization using TCAD Software: Case Study for Biomedical Applications. IEEE UKCAS 2019, London, UK, 06 Dec 2019. (Accepted for Publication)

Sadi, Toufik, Badami, Oves, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Ding, Jie and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Physical Insights into the Transport Properties of RRAMs Based on Transition Metal Oxides. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404(doi: 10.1109/SISPAD.2019.8870391)

Thirunavukkarasu, V. et al. (2019)Efficient Coupled-mode space based Non-Equilibrium Green’s Function Approach for Modeling Quantum Transport and Variability in Vertically Stacked SiNW FETs. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404(doi: 10.1109/SISPAD.2019.8870400)

Medina-Bailon, Cristina, Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Klüpfel, Sylvain, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Scaling-aware TCAD Parameter Extraction Methodology for Mobility Prediction in Tri-gate Nanowire Transistors. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404(doi: 10.1109/SISPAD.2019.8870556)

Medina-Bailon, Cristina, Sadi, Toufik, Nedjalkov, Mihail, Carrillo-Nuñez, Hamilton, Lee, Jaehyun, Badami, Oves, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Mobility of circular and elliptical si nanowire transistors using a multi-subband 1d formalism. IEEE Electron Device Letters, 40(10), pp. 1571-1574. (doi: 10.1109/LED.2019.2934349)

Carrillo-Nunez, Hamilton, Dimitrova, Nadezhda, Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2019)Machine learning approach for predicting the effect of statistical variability in Si junctionless nanowire transistors. IEEE Electron Device Letters, 40(9), pp. 1366-1369. (doi: 10.1109/LED.2019.2931839)

Guan, Yunhe, Li, Zunchao, Carrillo-Nunez, Hamilton, Zhang, Yefei, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Liang, Feng(2019)An accurate analytical model for tunnel FET output characteristics. IEEE Electron Device Letters, 40(6), pp. 1001-1004. (doi: 10.1109/LED.2019.2914014)

Badami, Oves, Medina-Bailon, Cristina, Berrada, Salim, Carrillo-Nunez, Hamilton, Lee, Jaeyhun, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Comprehensive study of cross-section dependent effective masses for silicon based gate-all-around transistors. Applied Sciences, 9(9), 1895. (doi: 10.3390/app9091895)

Liang, J. et al. (2019)Investigation of Pt-salt-doped-standalone-multiwall carbon nanotubes for on-chip interconnect applications. IEEE Transactions on Electron Devices, 66(5), pp. 2346-2352. (doi: 10.1109/TED.2019.2901658)

Medina Bailon, Cristina, Padilla, Jose L., Sadi, Toufik, Sampedro, Carlos, Godoy, Andres, Donetti, Luca, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Multisubband ensemble Monte Carlo analysis of tunneling leakage mechanisms in ultrascaled FDSOI, DGSOI, and FinFET devices. IEEE Transactions on Electron Devices, 66(3), pp. 1145-1152. (doi: 10.1109/TED.2019.2890985)

Sadi, Toufik, Medina Bailon, Cristina, Nedjalkov, Mihail, Lee, Jaehyun, Badami, Oves, Berrada, Salim, Carrillo-Nunez, Hamilton, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Simulation of the impact of ionized impurity scattering on the total mobility in Si nanowire transistors. Materials, 12(1), 124. (doi: 10.3390/ma12010124)

Duan, M. ORCID logo ORCID: https://orcid.org/0000-0002-0205-9423, Navarro, C., Cheng, B., Adamu-Lema, F., Wang, X., Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F., Millar, C. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2019)Thorough understanding of retention time of Z2FET memory operation. IEEE Transactions on Electron Devices, 66(1), pp. 383-388. (doi: 10.1109/TED.2018.2877977)

Carrillo-Nunez, Hamilton, Wang, Chen, Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366, Young, Robert and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2019)Simulation of Si Nanowire Quantum-Dot Devices for Authentication. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587(doi: 10.1109/EUROSOI-ULIS45800.2019.9041864)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Medina-Bailon, Cristina, Carrillo-Nunez, Hamilton, Badami, Oves, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Schrödinger Equation Based Quantum Corrections in Drift-Diffusion: A Multiscale Approach. In: 2019 IEEE 14th Nanotechnology Materials and Devices Conference (NMDC), Stockholm, Sweden, 27-30 Oct 2019, ISBN 9781728126371(doi: 10.1109/NMDC47361.2019.9084010)

Lee, Jaehyun, Lamarche, Michel and Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2019)The First-Priniple Simulation Study on the Specific Grain Boundary Resistivity in Copper Interconnects. In: 2018 IEEE 13th Nanotechnology Materials & Devices Conference (NMDC 2018), Portland, OR, USA, 14-17 Oct 2018, ISBN 9781538610169(doi: 10.1109/NMDC.2018.8605907)

Lee, Jaehyun, Medina-Bailon, Cristina, Berrada, Salim, Carrillo-Nunez, Hamilton, Sadi, Toufik, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Nedjalkov, Mihail and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)A Multi-Scale Simulation Study of the Strained Si Nanowire FETs. In: 2018 IEEE 13th Nanotechnology Materials & Devices Conference (NMDC 2018), Portland, OR, USA, 14-17 Oct 2018, ISBN 9781538610169(doi: 10.1109/NMDC.2018.8605884)

Mathew, Paven Thomas, Fang, Fengzhou, Vila-Nadal, Laia ORCID logo ORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Lee ORCID: https://orcid.org/0000-0001-8035-5757 and Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508(2019)First Principle Simulations of Current Flow in Inorganic Molecules: Polyoxometalates (POMs). In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587(doi: 10.1109/EUROSOI-ULIS45800.2019.9041869)

McGhee, Joseph, Moran, David A. ORCID logo ORCID: https://orcid.org/0000-0003-4085-7650 and Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508(2019)Simulations of Surface Transfer Doping of Hydrogenated Diamond by MoO3 Metal Oxide. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587(doi: 10.1109/EUROSOI-ULIS45800.2019.9041887)

Medina Bailon, Cristina, Sadi, Toufik, Sampedro, Carlos, Padilla, Jose Luis, Donetti, Luca, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Impact of the trap attributes on the gate leakage mechanisms in a 2D MS-EMC nanodevice simulator. In: Nikolov, Geno, Kolkovska, Natalia and Georgiev, Krassimir (eds.)Numerical Methods and Applications. Series: Lecture Notes in Computer Science, 11189 (11189). Springer, pp. 273-280. ISBN 9783030106911(doi: 10.1007/978-3-030-10692-8_30)

Sadi, Toufik, Badami, Oves, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2019)Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs. In: 12th International Conference on Large-Scale Scientific Computing, LSSC 2019, Sozopol, Bulgaria, 10-14 June 2019, pp. 429-437. (doi: 10.1007/978-3-030-41032-2_49)

2018

Lee, Jaehyun, Badami, Oves, Carrillo-Nunez, Hamilton, Berrada, Salim, Medina-Bailon, Cristina, Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Variability predictions for the next technology generations of n-type SixGe1-x nanowire MOSFETs. Micromachines, 9(12), 643. (doi: 10.3390/mi9120643)

Berrada, Salim, Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Carrillo-Nunez, Hamilton, Duan, Meng ORCID: https://orcid.org/0000-0002-0205-9423, Adamu-Lema, Fikru, Lee, Jaehyun, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Medina Bailon, Cristina and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)NESS: new flexible Nano-Electronic Simulation Software. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 22-25. ISBN 9781538667910(doi: 10.1109/SISPAD.2018.8551701)

Berrada, Salim, Lee, Jaehyun, Carrillo-Nunez, Hamilton, Medina Bailon, Cristina, Adamu-Lema, Fikru, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Quantum Transport Investigation of Threshold Voltage Variability in Sub-10 nm JunctionlessSi Nanowire FETs. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 244-247. ISBN 9781538667910(doi: 10.1109/SISPAD.2018.8551638)

Duan, Meng ORCID logo ORCID: https://orcid.org/0000-0002-0205-9423, Cheng, Binjie, Adamu-Lema, Fikru, Asenov, P., Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Wang, Xingsheng, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508, Millar, C., Pfaeffli, P. and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Statistical Variability Simulation of Novel Capacitor-less Z2FET DRAM: From Transistor Circuit. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA, 24-26 Sept. 2018, pp. 258-261. ISBN 9781538667903(doi: 10.1109/SISPAD.2018.8551710)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Interplay of RDF and Gate LER Induced Statistical Variability in Negative Capacitance FETs. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA, 24-26 Sept. 2018, pp. 262-265. ISBN 9781538667903(doi: 10.1109/SISPAD.2018.8551710)

Medina Bailon, Cristina, Sadi, Toufik, Nedjalkov, Mihail, Lee, Jaehyun, Berrada, Salim, Carrillo-Nunez, Hamilton, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Impact of the Effective Mass on the Mobility in Si Nanowire Transistors. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 297-300. ISBN 9781538667910(doi: 10.1109/SISPAD.2018.8551630)

Medina Bailon, Cristina, Sampedro, Carlos, Padilla, Jose Luis, Godoy, Andres, Donetti, Luca, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen(2018)Impact of Strain on S/D tunneling in FinFETs: a MS-EMC study. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 301-304. ISBN 9781538667910(doi: 10.1109/SISPAD.2018.8551707)

Chen, R. et al. (2018)Variability study of MWCNT local interconnects considering defects and contact resistances - Part I: pristine MWCNT. IEEE Transactions on Electron Devices, 65(11), pp. 4955-4962. (doi: 10.1109/TED.2018.2868421)

Chen, R. et al. (2018)Variability study of MWCNT local interconnects considering defects and contact resistances - Part II: impact of charge transfer doping. IEEE Transactions on Electron Devices, 65(11), pp. 4963-4970. (doi: 10.1109/TED.2018.2868424)

Liang, Jie, Lee, Jaehyun, Berrada, Salim, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Pandey, Reetu Raj, Chen, Rongmei, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Todri-Sanial, Aida(2018)Atomistic to circuit-level modeling of doped SWCNT for on-chip interconnects. IEEE Transactions on Nanotechnology, 17(6), pp. 1084-1088. (doi: 10.1109/TNANO.2018.2802320)

Carrillo-Nunez, Hamilton, Lee, Jaehyun, Berrada, Salim, Medina-Bailon, Cristina, Adamu-Lema, Fikru, Luisier, Mathieu, Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508(2018)Random dopant-induced variability in Si-InAs nanowire tunnel FETs: a quantum transport simulation study. IEEE Electron Device Letters, 39(9), pp. 1473-1476. (doi: 10.1109/LED.2018.2859586)

Lee, J. et al. (2018)Understanding electromigration in Cu-CNT composite interconnects: a multiscale electrothermal simulation study. IEEE Transactions on Electron Devices, 65(9), pp. 3884-3892. (doi: 10.1109/TED.2018.2853550)

Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508(2018)Development of Hierarchical Simulation Framework for Design and Optimization of Molecular Based Flash Cell. In: 2018 76th Device Research Conference (DRC), Santa Barbara, CA, USA, 24-27 Jun 2018, ISBN 9781538630280(doi: 10.1109/DRC.2018.8442234)

Uhlig, B. et al. (2018)Challenges and Progress on Carbon Nanotube Integration for BEOL Interconnects. In: 2018 IEEE International Interconnect Technology Conference (IITC), Santa Clara, CA, USA, 4-7 Jun 2018, pp. 16-18. ISBN 9781538643372(doi: 10.1109/IITC.2018.8430411)

Dutta, Tapas ORCID logo ORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Random Discrete Dopant Induced Variability in Negative Capacitance Transistors. In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain, 19-21 Mar 2018, ISBN 9781538648117(doi: 10.1109/ULIS.2018.8354732)

Medina Bailon, C., Sadi, T., Nedjalkov, M., Lee, J., Berrada, S., Carrillo-Nunez, H., Georgiev, V. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, S. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2018)Study of the 1D Scattering Mechanisms' Impact on the Mobility in Si Nanowire Transistors. In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain, 19-21 Mar 2018, ISBN 9781538648117(doi: 10.1109/ULIS.2018.8354723)

Carrillo-Nuñez, Hamilton, Mirza, Muhamad M. ORCID logo ORCID: https://orcid.org/0000-0002-1789-224X, Paul, Douglas J. ORCID: https://orcid.org/0000-0001-7402-8530, MacLaren, Donald A. ORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508(2018)Impact of randomly distributed dopants on Ω-gate junctionless silicon nanowire transistors. IEEE Transactions on Electron Devices, 65(5), pp. 1692-1698. (doi: 10.1109/TED.2018.2817919)

Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Dochioiu, Alexandru-Iusti, Adamu-Lema, Fikru, Berrada, Salim, Mirza, Muhammad M. ORCID: https://orcid.org/0000-0002-1789-224X, Paul, Douglas ORCID: https://orcid.org/0000-0001-7402-8530 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Variability Study of High Current Junctionless Silicon Nanowire Transistors. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, ISBN 9781538627723(doi: 10.1109/NMDC.2017.8350514)

Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Vila-Nadal, Laia ORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Leroy ORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2018)Molecular Based Flash Cell for Low Power Flash Application: Optimization and Variability Evaluation. In: IEEE 12th Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, pp. 64-65. ISBN 9781538627723(doi: 10.1109/NMDC.2017.8350505)

Uhlig, B. et al. (2018)Progress on Carbon Nanotube BEOL Interconnects. In: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), Dresden, Germany, 19-23 Mar 2018, pp. 937-942. ISBN 9783981926309(doi: 10.23919/DATE.2018.8342144)

Liang, J., Lee, J., Berrada, S., Georgiev, V. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366, Azemard-Crestani, A. and Todri-Sanial, A.(2018)Atomistic to Circuit Level Modeling of Defective Doped SWCNTs with Contacts for On-Chip Interconnect Application. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, pp. 66-67. ISBN 9781538627723(doi: 10.1109/NMDC.2017.8350506)

2017

Thirunavukkarasu, V. et al. (2017)Investigation of inversion, accumulation and junctionless mode bulk Germanium FinFETs. Superlattices and Microstructures, 111, pp. 649-655. (doi: 10.1016/j.spmi.2017.07.020)

Adamu-Lema, Fikru, Duan, Meng ORCID logo ORCID: https://orcid.org/0000-0002-0205-9423, Navarro, Carlos, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Cheng, Binjie, Wang, Xingsheng, Millar, Campbell, Gamiz, Francisco and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)Simulation Based DC and Dynamic Behaviour Characterization of Z2FET. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 317-320. (doi: 10.23919/SISPAD.2017.8085328)

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)Does a Nanowire Transistor Follow the Golden Ratio? A 2D Poisson-Schrödinger/3D Monte Carlo Simulation Study. In: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan, 7-9 Sept 2017,(doi: 10.23919/SISPAD.2017.8085263)

Duan, M. ORCID logo ORCID: https://orcid.org/0000-0002-0205-9423, Adamu-Lema, F., Cheng, B., Navarro, C., Wang, X., Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F., Millar, C. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2017)2D-TCAD Simulation on Retention Time of Z2FET for DRAM Application. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 325-328. (doi: 10.23919/SISPAD.2017.8085330)

Lee, J. et al. (2017)The Impact of Vacancy Defects on CNT Interconnects: From Statistical Atomistic Study to Circuit Simulations. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 157-160. (doi: 10.23919/SISPAD.2017.8085288)

Lee, J. et al. (2017)Atoms-to-Circuits Simulation Investigation of CNT Interconnects for Next Generation CMOS Technology. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 153-156. (doi: 10.23919/SISPAD.2017.8085287)

Wang, Xingsheng, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru, Gerrer, Louis, Amoroso, Salvatore M. and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)TCAD-based design technology co-optimization for variability in nanoscale SOI FinFETs. In: Deleonibus, Simon (ed.)Integrated Nanodevice and Nanosystem Fabrication. Series: Pan Stanford series on intelligent nanosystems. Pan Stanford: Singapore, pp. 215-252. ISBN 9789814774222

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)Simulation study of vertically stacked lateral Si nanowires transistors for 5 nm CMOS applications. IEEE Journal of the Electron Devices Society, 5(6), pp. 466-472. (doi: 10.1109/JEDS.2017.2752465)

Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Mirza, Muhammad M. ORCID: https://orcid.org/0000-0002-1789-224X, Dochioiu, Alexandru-Iustin, Lema, Fikru-Adamu, Amoroso, Salvatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A. ORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Paul, Douglas J. ORCID logo ORCID: https://orcid.org/0000-0001-7402-8530(2017)Experimental and simulation study of 1D silicon nanowire transistors using heavily doped channels. IEEE Transactions on Nanotechnology, 16(5), pp. 727-735. (doi: 10.1109/TNANO.2017.2665691)

Berrada, Salim, Lee, Jaehyun, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)Effect of the Quantum Mechanical Tunneling on the Leakage Current in Ultra-scaled Si Nanowire Transistors. 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017.

Medina-Bailon, C., Sadi, T., Sampedro, C., Padilla, J.L., Godoy, A., Donetti, L., Georgiev, V. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2017)Assessment of Gate Leakage Mechanism Utilizing Multi-Subband Ensemble Monte Carlo. In: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Athens, Greece, 03-05 Apr 2017, pp. 144-147. ISBN 9781509053148(doi: 10.1109/ULIS.2017.7962585)

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508, Sadi, Toufik, Wang, Yijiao, Adamu-Lema, Fikru, Wang, Xingsheng, Amoroso, Salvatore M., Towie, Ewan, Brown, Andrew and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)Impact of quantum confinement on transport and the electrostatic driven performance of silicon nanowire transistors at the scaling limit. Solid-State Electronics, 129, pp. 73-80. (doi: 10.1016/j.sse.2016.12.015)

Lee, Jaehyun, Sadi, Toufik, Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Todri-Sanial, Aida and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)A Hierarchical Model for CNT and Cu-CNT Composite Interconnects: From Density Functional Theory to Circuit-Level Simulations. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017. (Unpublished)

Adamu-Lema, Fikru, Duan, Meng ORCID logo ORCID: https://orcid.org/0000-0002-0205-9423, Berrada, Salim, Lee, Jaehyun, Al-Ameri, T. ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2017)Modelling and simulation of advanced semiconductor devices. ECS Transactions, 80(4), pp. 33-42. (doi: 10.1149/08004.0033ecst)

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2017)Position-Dependent Performance in 5 nm Vertically Stacked Lateral Si Nanowires Transistors. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017.

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2017)Variability-Aware Simulations of 5 nm Vertically Stacked Lateral Si Nanowires Transistors. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017.

Liang, J. et al. (2017)A Physics-based Investigation of Pt-salt Doped Carbon Nanotubes for Local Interconnects. In: 2017 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 02-06 Dec 2017, 35.5.1-35.5.4. ISBN 9781538635599(doi: 10.1109/IEDM.2017.8268502)

Medina-Bailon, C., Sampedro, C., Padilla, J.L., Godoy, A., Donetti, L., Gamiz, F., Sadi, T., Georgiev, V. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2017)Multi-subband Ensemble Monte Carlo Study of Tunneling Leakage mechanisms. In: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan, 7-9 Sept 2017, pp. 281-284. ISBN 9784863486102(doi: 10.23919/SISPAD.2017.8085319)

Todri-Sanial, A. et al. (2017)A survey of carbon nanotube interconnects for energy efficient integrated circuits. IEEE Circuits and Systems Magazine, 17(2), pp. 47-62. (doi: 10.1109/MCAS.2017.2689538)

2016

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508, Lema, Adamu, Sadi, T., Towie, E., Riddet, C., Alexander, C. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2016)Performance of Vertically Stacked Horizontal Si Nanowires Transistors: A 3D Monte Carlo / 2D Poisson Schrodinger Simulation Study. In: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), Toulouse, France, 9-12 Oct 2016, ISBN 9781509043521(doi: 10.1109/NMDC.2016.7777117)

Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Mirza, Muhammad M. ORCID: https://orcid.org/0000-0002-1789-224X, Dochioiu, Alexandru-Iustin, Lema, Fikru-Adamu, Amoroso, Salvatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A. ORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366 and Paul, Douglas J. ORCID logo ORCID: https://orcid.org/0000-0001-7402-8530(2016)Experimental and Simulation Study of a High Current 1D Silicon Nanowire Transistor Using Heavily Doped Channels. In: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), Toulouse, France, 9-12 Oct 2016, ISBN 9781509043521(doi: 10.1109/NMDC.2016.7777084)

Sadi, Toufik, Towie, Ewan, Nedjalkov, Mihail, Riddet, Craig, Alexander, Craig, Wang, Liping, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Brown, Andrew, Millar, Campbell and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2016)One-Dimensional Multi-Subband Monte Carlo Simulation of Charge Transport in Si Nanowire Transistors. In: SISPAD 2016: International Conference on Simulation of Semiconductor Processes and Devices, Nuremberg, Germany, 6-8 Sept 2016, pp. 23-26. ISBN 9781509008186(doi: 10.1109/SISPAD.2016.7605139)

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar P. ORCID: https://orcid.org/0000-0001-6473-2508, Lema, Fikru-Adama, Sadi, Toufik, Wang, Xingsheng, Towie, Ewan, Riddet, Craig, Alexander, Craig and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2016)Impact of Strain on the Performance of Si Nanowires Transistors at the Scaling Limit: A 3D Monte Carlo/2D Poisson Schrodinger Simulation Study. In: SISPAD 2016: International Conference on Simulation of Semiconductor Processes and Devices, Nuremberg, Germany, 6-8 Sept 2016, pp. 213-216. ISBN 9781509008186(doi: 10.1109/SISPAD.2016.7605185)

Al-Ameri, Talib ORCID logo ORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar ORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2016)Influence of Quantum Confinement Effects and Device Electrostatic Driven Performance in Ultra-Scaled SixGe1-x Nanowire Transistors. In: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2016), Vienna, Austria, 25-27 Jan 2016, pp. 234-237. ISBN 9781467386104(doi: 10.1109/ULIS.2016.7440096)

Asenov, A. ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366, Wang, Y., Cheng, B., Wang, X., Asenov, P., Al-Ameri, T. ORCID: https://orcid.org/0000-0002-0666-2449 and Georgiev, V.P. ORCID: https://orcid.org/0000-0001-6473-2508(2016)Nanowire Transistor Solutions for 5NM and Beyond. In: 2016 17th International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, USA, 15-16 Mar 2016, pp. 269-274. (doi: 10.1109/ISQED.2016.7479212)

2015

Georgiev, V.P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Ali, T. ORCID: https://orcid.org/0000-0002-0666-2449, Wang, Y., Gerrer, L., Amoroso, S.M. and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2015)Influence of Quantum Confinement Effects over Device Performance in Circular and Elliptical Silicon Nanowire Transistors. In: 2015 International Workshop on Computational Electronics (IWCE), West Lafayette, IN, USA, 2-4 Sept 2015,(doi: 10.1109/IWCE.2015.7301960)

Donetti, Luca, Sampedro, Carlos, Gamiz, Francisco, Godoy, Andres, Garcıa-Ruız, Francisco J., Towie, Ewan, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore Maria, Riddet, Craig and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2015)Multi-Subband Ensemble Monte Carlo Simulation of Si Nanowire MOSFETs. In: SISPAD: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 353-356. ISBN 9781467378581(doi: 10.1109/SISPAD.2015.7292332)

Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore M., Gerrer, Louis, Adamu-Lema, Fikru and Asenov, Asen ORCID: https://orcid.org/0000-0002-9567-6366(2015)Interplay between quantum mechanical effects and a discrete trap position in ultrascaled FinFETs. In: SISPAD 2015: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 246-249. ISBN 9781467378581(doi: 10.1109/SISPAD.2015.7292305)

Kivisaari, Pyry, Sadi, Toufik, Li, Jingrui, Georgiev, Vihar ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Oksanen, Jani, Rinke, Patrick and Tulkki, Jukka(2015)Bipolar Monte Carlo Simulation of Hot Carriers In III-N LEDs. In: SISPAD: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 393-396. ISBN 9781467378581(doi: 10.1109/SISPAD.2015.7292342)

Wang, Y. et al. (2015)Simulation study of the impact of quantum confinement on the electrostatically driven oerformance of n-type nanowire transistors. IEEE Transactions on Electron Devices, 62(10), pp. 3229-3236. (doi: 10.1109/TED.2015.2470235)

Gerrer, L., Georgiev, V. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, S.M., Towie, E. and Asenov, A. ORCID: https://orcid.org/0000-0002-9567-6366(2015)Comparison of Si <100> and <110> crystal orientation nanowire transistor reliability using Poisson–Schrödinger and classical simulations. Microelectronics Reliability, 55(9-10), pp. 1307-1312. (doi: 10.1016/j.microrel.2015.06.094)

Georgiev, Vihar P. ORCID logo ORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore Maria, Ali, Talib Mahmood, Vila-Nadal, Laia ORCID: https://orcid.org/0000-0002-7718-7227, Busche, Christoph ORCID: https://orcid.org/0000-0002-3493-2020, Cronin, Leroy ORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logo ORCID: https://orcid.org/0000-0002-9567-6366(2015)Comparison between bulk and FDSOI POM flash cell: a multiscale simulation study. IEEE Transactions on Electron Devices, 62(2), pp. 680-684. (doi: 10.1109/TED.2014.2378378)