Gregory Wierzba - Academia.edu (original) (raw)
Papers by Gregory Wierzba
: The design, analysis and performance evaluation of the architecture of a mutiprocessor is prese... more : The design, analysis and performance evaluation of the architecture of a mutiprocessor is presented. The architecture is a hierarchically structured, functionally distributed, multiple microcomputer system. Its operating system is a multi-level structure implemented in an optimal combination of hardware, firmware, and software. This architecture is suited to any application, such as process control or real-time system simulation, in which the basic computational tasks do not change in time. Control functions are distributed among the microcomputer; however, the scheduling and execution of these tasks is governed at each microcomputer level by a local, real-time operating system. This local operating system is implemented primarily in firmware to minimize overhead. However, the control structure is designed to be independent of implementation so that a variety of microcomputers can be utilized together. Moreover, it is possible to add to each local processor an additional subproces...
Yield and reliability are two factors affecting the profitability of semiconductor manufacturing.... more Yield and reliability are two factors affecting the profitability of semiconductor manufacturing. High-temperature burn-in and extreme-voltage stress tests are two current industrial standard methods to speed up the deterioration of electronic devices and weed-out infant mortality. Extreme-voltage stress test aims at enhancing both quality and reliability without performance the high-cost burn-in test process. Our recent stress tests of analog/mixed–signal CMOS ICs for gate-oxide reliability enhance. This paper presents a control flow model for analog CMOS circuits and uses it to develop a circuit partition scheme. A practically large analog circuit can be partitioned into many smaller sub-circuits so that the developed stress vector generator and stressability analyzer can conformably handle in term of computational complexity. In addition, a structure-based stress vector generation process is also developed. Stress vectors are generated based on the circuit topological structure w...
Yield and reliability are two factors affecting the profitability of semiconductor manufacturing.... more Yield and reliability are two factors affecting the profitability of semiconductor manufacturing. High-temperature burn-in and extreme-voltage stress tests are two current industrial standard methods to speed up the deterioration of electronic devices and weed-out infant mortality. Extreme-voltage stress test aims at enhancing both quality and reliability without performance the high-cost burn-in test process. Our recent stress tests of analog/mixed-signal CMOS ICs for gate-oxide reliability enhance. This paper presents a control flow model for analog CMOS circuits and uses it to develop a circuit partition scheme. A practically large analog circuit can be partitioned into many smaller sub-circuits so that the developed stress vector generator and stressability analyzer can conformably handle in term of computational complexity. In addition, a structure-based stress vector generation process is also developed. Stress vectors are generated based on the circuit topological structure w...
A class-G amplifier is a power amplifier that can achieve better power efficiency than the class-... more A class-G amplifier is a power amplifier that can achieve better power efficiency than the class-B amplifier. For these amplifiers, low distortion is achieved with large values of power supply voltage. A new class-G/FB amplifier is proposed using an operational amplifier with a class-G power stage and feedback to lower the total harmonic distortion of the amplifier rather than using large power supply voltages. Methods for identifying and solving the stability problems associated with this class-G/FB amplifier are presented. The efficiency of this amplifier is examined along with experimental results.
IEEE Transactions on Circuits and Systems
Int J Electron, 1993
The authors describe a simple procedure for using PSPICE to calculate the relative stability of a... more The authors describe a simple procedure for using PSPICE to calculate the relative stability of an active circuit. The active circuit can be implemented using a variety of active devices, including op amps, current conveyors, transimpedance amplifiers, and operational transconductance amplifiers. This procedure can be used with the PSPICE macromodels provided by amplifier manufacturers. This procedure is applied to circuits
Proceedings of 36th Midwest Symposium on Circuits and Systems, 1993
... This has proven a handy tool and has been used by companies, like Texas Instruments, to provi... more ... This has proven a handy tool and has been used by companies, like Texas Instruments, to provide libraries and even databooks of characterized parts. ... References 'Dl HL 23) NDl = T [l] IE Getreu, AD Hadiwidjaja and JM Brinch, "An Integrated-Circuit Comparator Macro-mode1 ...
[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems, 1992
[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems, 1992
A macromodel has been developed for the LM117 adjustable positive voltage regulator. This model p... more A macromodel has been developed for the LM117 adjustable positive voltage regulator. This model predicts AC, DC, transient, and power-up responses. Design formulas for finding the component values of the macromodel which are based on pin measurements are presented. The methodology of development is presented along with experimental and simulated results
IEEE International Symposium on Circuits and Systems, 1989
... 8. Milor, L. and V. Visvanathan, "Efficient GO/NO-GO Testing of Analog Circuits," P... more ... 8. Milor, L. and V. Visvanathan, "Efficient GO/NO-GO Testing of Analog Circuits," Proc. of IEEE 1987 International Symp. on Circuits and Systems, Philadephia, PA, pp.414-417, May 1987. IEEE Design and Test of Computers, Vo1.2, No.2, pp.21-28, April 1985. 10. Wey, CL, Jiang ...
[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems, 1992
A macromodel for a CA3085 regulator is presented. The CA3085 is an 8-pin, adjustable, positive vo... more A macromodel for a CA3085 regulator is presented. The CA3085 is an 8-pin, adjustable, positive voltage regulator. Design formulas are presented. The room temperature model is presented first. Then this model is adapted to produce a model to predict results at -55°C and 125°C. Finally, a comparison with laboratory results is presented
Proceedins of the 14th ACM Great Lakes symposium on VLSI - GLSVLSI '04, 2004
Yield and reliability are two factors affecting the profitability of semiconductor manufacturing.... more Yield and reliability are two factors affecting the profitability of semiconductor manufacturing. High-temperature burn-in and extreme-voltage stress tests are two current industrial standard methods to speed up the deterioration of electronic devices and weed-out infant mortality. Extreme-voltage stress test aims at enhancing both quality and reliability without performance the high-cost burn-in test process. Our recent stress tests of analog/mixed-signal CMOS
IEEE Transactions on Circuits and Systems, 1986
Methods are presented for generating ideal op-amp circuits by relocating the op-amp in a given re... more Methods are presented for generating ideal op-amp circuits by relocating the op-amp in a given realization. Formulas are developed for determining, by inspection, the minimum number of realizations which have identical network equations or which have the same characteristic equation. It is shown that the basic 3-op-amp Mikhael-Bhattacharyya RC active filter has at least 95 other possible 3-op-amp realizations, all
[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems, 1992
A novel symbolic circuit analysis strategy, its matrix reduction, and its numerical approximation... more A novel symbolic circuit analysis strategy, its matrix reduction, and its numerical approximation during computation methodologies are presented. These methods have been implemented in Sspice version 2.0. Together with the unique decomposition approach of Sspice 2.0, Sspice has successfully analyzed the full schematics of commercial op-amps and power regulators in developing their macro-models. The matrix reduction scheme and numerical approximation are presented in order to improve the efficiency of computation and memory consumption
Journal of the Franklin Institute, 1980
A linearly variable element is any passive two-terminal network element in which the immittance u... more A linearly variable element is any passive two-terminal network element in which the immittance uaries linearly with respect to an independent (of frequency) real variable, x. A definite set of fundamental passive two terminal network elements (Felements) consisting of fixed passive elements and linearly variable elements is presented. It is shown that any network consisting of only F-elements has a driving point immittance, D(s, x), that is positive real for s complex, x real and positiue real for x complex, s real. Conditions on the variable coefficients, degree and location of zeros and poles of D(s, x) are established. A method of testing whether D(s, x) is positive real for one complex and one real variable is developed. This testing is accomplished by extending the Hurwitz and Sturm tests to one complex and one real variable.
Journal of the Franklin Institute, 1980
Synthesis techniques are given for any one element kind driving point function in two variables, ... more Synthesis techniques are given for any one element kind driving point function in two variables, s and x. Conditions for the realization of some two element kind driving point functions in s and x are also developed. Using active elements, any such function is shown to be realizable. Driving point functions in s and x with certain types of fixed (independent of x) and varying (dependent on x) real zeros and poles are shown to be realizable using only F-elements. Applications are presented.
IEEE Transactions on Consumer Electronics, 2000
A Class-G amplifier is a power amplifier that can achieve better power efficiency than the Class-... more A Class-G amplifier is a power amplifier that can achieve better power efficiency than the Class-B amplifier. For these amplifiers, low distortion is achieved with large values of power supply voltage. A new Class-G/FB amplifier is proposed using an operational amplifier with a Class-G power stage and feedback to lower the total harmonic distortion of the amplifier rather than using large power supply voltages. Methods for identifying and solving the stability problems associated with this Class-G/FB amplifier are presented. The efficiency of this amplifier is examined along with experimental results. 1
: The design, analysis and performance evaluation of the architecture of a mutiprocessor is prese... more : The design, analysis and performance evaluation of the architecture of a mutiprocessor is presented. The architecture is a hierarchically structured, functionally distributed, multiple microcomputer system. Its operating system is a multi-level structure implemented in an optimal combination of hardware, firmware, and software. This architecture is suited to any application, such as process control or real-time system simulation, in which the basic computational tasks do not change in time. Control functions are distributed among the microcomputer; however, the scheduling and execution of these tasks is governed at each microcomputer level by a local, real-time operating system. This local operating system is implemented primarily in firmware to minimize overhead. However, the control structure is designed to be independent of implementation so that a variety of microcomputers can be utilized together. Moreover, it is possible to add to each local processor an additional subproces...
Yield and reliability are two factors affecting the profitability of semiconductor manufacturing.... more Yield and reliability are two factors affecting the profitability of semiconductor manufacturing. High-temperature burn-in and extreme-voltage stress tests are two current industrial standard methods to speed up the deterioration of electronic devices and weed-out infant mortality. Extreme-voltage stress test aims at enhancing both quality and reliability without performance the high-cost burn-in test process. Our recent stress tests of analog/mixed–signal CMOS ICs for gate-oxide reliability enhance. This paper presents a control flow model for analog CMOS circuits and uses it to develop a circuit partition scheme. A practically large analog circuit can be partitioned into many smaller sub-circuits so that the developed stress vector generator and stressability analyzer can conformably handle in term of computational complexity. In addition, a structure-based stress vector generation process is also developed. Stress vectors are generated based on the circuit topological structure w...
Yield and reliability are two factors affecting the profitability of semiconductor manufacturing.... more Yield and reliability are two factors affecting the profitability of semiconductor manufacturing. High-temperature burn-in and extreme-voltage stress tests are two current industrial standard methods to speed up the deterioration of electronic devices and weed-out infant mortality. Extreme-voltage stress test aims at enhancing both quality and reliability without performance the high-cost burn-in test process. Our recent stress tests of analog/mixed-signal CMOS ICs for gate-oxide reliability enhance. This paper presents a control flow model for analog CMOS circuits and uses it to develop a circuit partition scheme. A practically large analog circuit can be partitioned into many smaller sub-circuits so that the developed stress vector generator and stressability analyzer can conformably handle in term of computational complexity. In addition, a structure-based stress vector generation process is also developed. Stress vectors are generated based on the circuit topological structure w...
A class-G amplifier is a power amplifier that can achieve better power efficiency than the class-... more A class-G amplifier is a power amplifier that can achieve better power efficiency than the class-B amplifier. For these amplifiers, low distortion is achieved with large values of power supply voltage. A new class-G/FB amplifier is proposed using an operational amplifier with a class-G power stage and feedback to lower the total harmonic distortion of the amplifier rather than using large power supply voltages. Methods for identifying and solving the stability problems associated with this class-G/FB amplifier are presented. The efficiency of this amplifier is examined along with experimental results.
IEEE Transactions on Circuits and Systems
Int J Electron, 1993
The authors describe a simple procedure for using PSPICE to calculate the relative stability of a... more The authors describe a simple procedure for using PSPICE to calculate the relative stability of an active circuit. The active circuit can be implemented using a variety of active devices, including op amps, current conveyors, transimpedance amplifiers, and operational transconductance amplifiers. This procedure can be used with the PSPICE macromodels provided by amplifier manufacturers. This procedure is applied to circuits
Proceedings of 36th Midwest Symposium on Circuits and Systems, 1993
... This has proven a handy tool and has been used by companies, like Texas Instruments, to provi... more ... This has proven a handy tool and has been used by companies, like Texas Instruments, to provide libraries and even databooks of characterized parts. ... References 'Dl HL 23) NDl = T [l] IE Getreu, AD Hadiwidjaja and JM Brinch, "An Integrated-Circuit Comparator Macro-mode1 ...
[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems, 1992
[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems, 1992
A macromodel has been developed for the LM117 adjustable positive voltage regulator. This model p... more A macromodel has been developed for the LM117 adjustable positive voltage regulator. This model predicts AC, DC, transient, and power-up responses. Design formulas for finding the component values of the macromodel which are based on pin measurements are presented. The methodology of development is presented along with experimental and simulated results
IEEE International Symposium on Circuits and Systems, 1989
... 8. Milor, L. and V. Visvanathan, "Efficient GO/NO-GO Testing of Analog Circuits," P... more ... 8. Milor, L. and V. Visvanathan, "Efficient GO/NO-GO Testing of Analog Circuits," Proc. of IEEE 1987 International Symp. on Circuits and Systems, Philadephia, PA, pp.414-417, May 1987. IEEE Design and Test of Computers, Vo1.2, No.2, pp.21-28, April 1985. 10. Wey, CL, Jiang ...
[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems, 1992
A macromodel for a CA3085 regulator is presented. The CA3085 is an 8-pin, adjustable, positive vo... more A macromodel for a CA3085 regulator is presented. The CA3085 is an 8-pin, adjustable, positive voltage regulator. Design formulas are presented. The room temperature model is presented first. Then this model is adapted to produce a model to predict results at -55°C and 125°C. Finally, a comparison with laboratory results is presented
Proceedins of the 14th ACM Great Lakes symposium on VLSI - GLSVLSI '04, 2004
Yield and reliability are two factors affecting the profitability of semiconductor manufacturing.... more Yield and reliability are two factors affecting the profitability of semiconductor manufacturing. High-temperature burn-in and extreme-voltage stress tests are two current industrial standard methods to speed up the deterioration of electronic devices and weed-out infant mortality. Extreme-voltage stress test aims at enhancing both quality and reliability without performance the high-cost burn-in test process. Our recent stress tests of analog/mixed-signal CMOS
IEEE Transactions on Circuits and Systems, 1986
Methods are presented for generating ideal op-amp circuits by relocating the op-amp in a given re... more Methods are presented for generating ideal op-amp circuits by relocating the op-amp in a given realization. Formulas are developed for determining, by inspection, the minimum number of realizations which have identical network equations or which have the same characteristic equation. It is shown that the basic 3-op-amp Mikhael-Bhattacharyya RC active filter has at least 95 other possible 3-op-amp realizations, all
[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems, 1992
A novel symbolic circuit analysis strategy, its matrix reduction, and its numerical approximation... more A novel symbolic circuit analysis strategy, its matrix reduction, and its numerical approximation during computation methodologies are presented. These methods have been implemented in Sspice version 2.0. Together with the unique decomposition approach of Sspice 2.0, Sspice has successfully analyzed the full schematics of commercial op-amps and power regulators in developing their macro-models. The matrix reduction scheme and numerical approximation are presented in order to improve the efficiency of computation and memory consumption
Journal of the Franklin Institute, 1980
A linearly variable element is any passive two-terminal network element in which the immittance u... more A linearly variable element is any passive two-terminal network element in which the immittance uaries linearly with respect to an independent (of frequency) real variable, x. A definite set of fundamental passive two terminal network elements (Felements) consisting of fixed passive elements and linearly variable elements is presented. It is shown that any network consisting of only F-elements has a driving point immittance, D(s, x), that is positive real for s complex, x real and positiue real for x complex, s real. Conditions on the variable coefficients, degree and location of zeros and poles of D(s, x) are established. A method of testing whether D(s, x) is positive real for one complex and one real variable is developed. This testing is accomplished by extending the Hurwitz and Sturm tests to one complex and one real variable.
Journal of the Franklin Institute, 1980
Synthesis techniques are given for any one element kind driving point function in two variables, ... more Synthesis techniques are given for any one element kind driving point function in two variables, s and x. Conditions for the realization of some two element kind driving point functions in s and x are also developed. Using active elements, any such function is shown to be realizable. Driving point functions in s and x with certain types of fixed (independent of x) and varying (dependent on x) real zeros and poles are shown to be realizable using only F-elements. Applications are presented.
IEEE Transactions on Consumer Electronics, 2000
A Class-G amplifier is a power amplifier that can achieve better power efficiency than the Class-... more A Class-G amplifier is a power amplifier that can achieve better power efficiency than the Class-B amplifier. For these amplifiers, low distortion is achieved with large values of power supply voltage. A new Class-G/FB amplifier is proposed using an operational amplifier with a Class-G power stage and feedback to lower the total harmonic distortion of the amplifier rather than using large power supply voltages. Methods for identifying and solving the stability problems associated with this Class-G/FB amplifier are presented. The efficiency of this amplifier is examined along with experimental results. 1