Robert Nuttelman - Academia.edu (original) (raw)

Robert Nuttelman

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Marciana Popescu

Amani Garvin

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Università degli studi di Modena e Reggio Emilia

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Papers by Robert Nuttelman

Research paper thumbnail of Energy resolution of a lithium-drifted silicon semiconductor detector alpha particle spectrometer

Variation of the Energy Resolution of the Spectrometer to 24lAm Alpha Particles with Detector Bia... more Variation of the Energy Resolution of the Spectrometer to 24lAm Alpha Particles with Detector Bias Voltage (x = 0.8 ysec). 75 30. Variation of the Energy Resolution of the Spectrometer to 241Â lpha Particles with Amplifier Time Constant (V,. = 40 Volts). r bias 31. Variation of the Energy Resolution of the Spectrometer to 241Â lpha Particles with Amplifier Time Constant (V^. = 70 Volts). r bias 32. Variation of the Energy Resolution of the Spectrometer to 241Â lpha Particles with Amplifier Time Constant (V,_. = 100 Volts). bias 33. Variation of Excess Energy Resolution Spreading FWHM with Detector Bias Voltage (x = 0.8 ysec) 34. Variation of Excess Energy Resolution Spreading FWHM with Amplifier Time Constant (V,. = 40, 70, and 100 Volts) 81 bias '

Research paper thumbnail of The Change of Soft X-Ray Mass Absorption Coefficient of Multiply Ionized Chromium

Research paper thumbnail of Optimum design of an intensity limited pinhole-scintillator, image converter camera model for simultaneous energy, spatial, and time resolution of soft X-rays

Air Force Interim Report, Aug 30, 1976

Abstract : This report describes the optimum design of a generalized pinhole-scintillator, image ... more Abstract : This report describes the optimum design of a generalized pinhole-scintillator, image converter camera model offering simultaneous energy, spatial, and time resolution of soft x-rays. This type of diagnostic system is particularly suited to analysis of x-rays from intense plasma discharge sources such as plasma focus and electromagnetic implosion devices having emitting dimensions in the mm to cm range and pulse lengths of 10 -1000 nsec. The usual diffraction limited, optimum pinhole design for spatial resolution is not used since sufficient x-ray intensities are often not available from laboratory plasmas to take advantage of optimum pinhole resolution. Instead, the condition for obtaining optimum spatial resolution for the intensity limited case for given time and energy resolution requirements are derived. The controlling requirement of film exposure is satisfied. Graphical solutions of optimum pinhole-to-scintillator distance, optimum pinhole diameter, and spatial resolution at optimum conditons are presented as a function of a dimensionless exposure parameter beta for several values of plasma-to-pinhole distance. This form of solution presentation allows rapid analysis of the effects of equipment changes and different degrees of time and energy resolution upon optimum spatial resolution. (Author)

Research paper thumbnail of Energy resolution of a lithium-drifted silicon semiconductor detector alpha particle spectrometer

Variation of the Energy Resolution of the Spectrometer to 24lAm Alpha Particles with Detector Bia... more Variation of the Energy Resolution of the Spectrometer to 24lAm Alpha Particles with Detector Bias Voltage (x = 0.8 ysec). 75 30. Variation of the Energy Resolution of the Spectrometer to 241Â lpha Particles with Amplifier Time Constant (V,. = 40 Volts). r bias 31. Variation of the Energy Resolution of the Spectrometer to 241Â lpha Particles with Amplifier Time Constant (V^. = 70 Volts). r bias 32. Variation of the Energy Resolution of the Spectrometer to 241Â lpha Particles with Amplifier Time Constant (V,_. = 100 Volts). bias 33. Variation of Excess Energy Resolution Spreading FWHM with Detector Bias Voltage (x = 0.8 ysec) 34. Variation of Excess Energy Resolution Spreading FWHM with Amplifier Time Constant (V,. = 40, 70, and 100 Volts) 81 bias '

Research paper thumbnail of The Change of Soft X-Ray Mass Absorption Coefficient of Multiply Ionized Chromium

Research paper thumbnail of Optimum design of an intensity limited pinhole-scintillator, image converter camera model for simultaneous energy, spatial, and time resolution of soft X-rays

Air Force Interim Report, Aug 30, 1976

Abstract : This report describes the optimum design of a generalized pinhole-scintillator, image ... more Abstract : This report describes the optimum design of a generalized pinhole-scintillator, image converter camera model offering simultaneous energy, spatial, and time resolution of soft x-rays. This type of diagnostic system is particularly suited to analysis of x-rays from intense plasma discharge sources such as plasma focus and electromagnetic implosion devices having emitting dimensions in the mm to cm range and pulse lengths of 10 -1000 nsec. The usual diffraction limited, optimum pinhole design for spatial resolution is not used since sufficient x-ray intensities are often not available from laboratory plasmas to take advantage of optimum pinhole resolution. Instead, the condition for obtaining optimum spatial resolution for the intensity limited case for given time and energy resolution requirements are derived. The controlling requirement of film exposure is satisfied. Graphical solutions of optimum pinhole-to-scintillator distance, optimum pinhole diameter, and spatial resolution at optimum conditons are presented as a function of a dimensionless exposure parameter beta for several values of plasma-to-pinhole distance. This form of solution presentation allows rapid analysis of the effects of equipment changes and different degrees of time and energy resolution upon optimum spatial resolution. (Author)

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