Shirley Turner - Academia.edu (original) (raw)
Papers by Shirley Turner
Eurochem's 7th International Workshop- Proficiency Testing in Analytical Chemistry, Microbiology, and Laboratory Medicine, Oct 1, 2011
The term NVLAP and the NVLAP logo are registered marks of the Federal Government, which retains e... more The term NVLAP and the NVLAP logo are registered marks of the Federal Government, which retains exclusive rights to control the use thereof. Permission to use the term and symbol (NVLAP logo with approved caption) is granted to NVLAP-accredited laboratories for the limited purpose of announcing their accredited status, and for use on reports that describe only testing and calibration within the scope of accreditation. NVLAP reserves the right to control the quality of the use of the NVLAP term, logo, and symbol. • Annex A (normative) and Annex B (informative) have been added. This handbook is also available on the NVLAP web site (http://www.nist.gov/nvlap).
Forensic Science Error Management Symposium, Jul 1, 2015
Microscopy and Microanalysis
MRS Proceedings, 1996
Nanophase TiO{sub 2} (n-TiO{sub 2}) particles were generated in a flame burner system under three... more Nanophase TiO{sub 2} (n-TiO{sub 2}) particles were generated in a flame burner system under three experimental conditions. Selected individual nanoparticles were identified and characterized using selected area electron diffraction, bright-field and, in some cases, dark-field imaging to determine morphology and microstructural features. Previously unknown TiO{sub 2} particles with unusual central features were identified as rutile. Electron holography was used to characterize the central features which were found to be consistent with voids. More extensive characterization of individual particles may lead to improved understanding of n-TiO{sub 2} nucleation and growth.
ABSTRACTNanophase TiO2 (n-TiO2) particles were generated in a flame burner system under three exp... more ABSTRACTNanophase TiO2 (n-TiO2) particles were generated in a flame burner system under three experimental conditions. Selected individual nanoparticles were identified and characterized using selected area electron diffraction, bright-field and, in some cases, dark-field imaging to determine morphology and microstructural features. Previously unknown TiO2 particles with unusual central features were identified as rutile. Electron holography was used to characterize the central features which were found to be consistent with voids. More extensive characterization of individual particles may lead to improved understanding of n-TiO2 nucleation and growth.
Microscopy and Microanalysis
Accurate characterization of electron diffraction patterns can be tedious, which encourages devel... more Accurate characterization of electron diffraction patterns can be tedious, which encourages development of computer assisted tools and methods. We developed a spot measurement tool to characterize rapidly arrays of diffraction spots that are characteristic of a single crystal, and to measure precisely the d-spacing values for individual spots. The spot tool determines these vectors for averaged measurements from many spots in a digital image of the diffraction pattern. Previously we developed automated methods for spot pattern analysis. Why make an operator-assisted tool? This tool is faster than either our automated or entirely manual methods, and it allows assessment of the quality of the data at the beginning of the analysis.It is easy to see regular patterns of spots in a zone axis diffraction pattern (Fig. 1.1). An operator guides the initial calculations by adjusting an array of circles to approximately cover the spots in the pattern to be analyzed.
Microscopy and Microanalysis
AIP Conference Proceedings
Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanaly... more Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the microelectronics industry as reference standards. Specimens with nominal compositions of 14 at. %, 6.5 at. %, and 3.5 at. % Ge were
Microscopy and Microanalysis, Aug 1, 2002
Microscopy and Microanalysis, Aug 1, 2003
MRS Proceedings, 1990
ABSTRACTFor studies of particles suspended in air or water, material is commonly deposited onto m... more ABSTRACTFor studies of particles suspended in air or water, material is commonly deposited onto membrane filters. Submicrometer particles collected in or on the surface of the filters can be prepared for analysis by TEM by extraction replica methods. To identify the problems and artifacts generated during the preparation process, evaluations were made of replicas prepared internally at NIST and prepared by laboratories involved in the analysis of air-collected asbestos. Problems or artifacts that could affect the counting and analysis of asbestos particles were identified and characterized. Results of evaluations of replicas prepared by eighteen laboratories in an interlaboratory study are summarized.
MRS Proceedings, 1999
ABSTRACTRutile nanoparticles containing voids or cavities have been characterized using transmiss... more ABSTRACTRutile nanoparticles containing voids or cavities have been characterized using transmission electron microscopy. The general morphology of the voids has been determined from images of nanoparticles in different orientations. In general, the longest dimension is along the c axis of rutile. Many of the voids show a prismatic morphology with dipyramid terminations. The prism consists of primarily four {110} faces with rounded or faceted comers between the primary faces. The pyramidal terminations can appear ovoid or faceted. A major facet plane of the pyramids is (101). A model consistent with the morphology of many voids in rutile nanoparticles is proposed.
Science (New York, N.Y.), Jan 14, 1983
Platy intergrowths of crystalline todorokite are associated with biogenic debris in the cores of ... more Platy intergrowths of crystalline todorokite are associated with biogenic debris in the cores of manganese nodules from a site in the Pacific Ocean. Analyses by electron diffraction and transmission electron microscopy demonstrate that this material is composed of tunnels of chains of linked MnO(6) octahedra. The chemical composition, morphology, and stability of the todorokite differ from those of nickel-and copper-rich manganese oxides in nodules that have been identified as todorokite or buserite in earlier investigations.
Eurochem's 7th International Workshop- Proficiency Testing in Analytical Chemistry, Microbiology, and Laboratory Medicine, Oct 1, 2011
The term NVLAP and the NVLAP logo are registered marks of the Federal Government, which retains e... more The term NVLAP and the NVLAP logo are registered marks of the Federal Government, which retains exclusive rights to control the use thereof. Permission to use the term and symbol (NVLAP logo with approved caption) is granted to NVLAP-accredited laboratories for the limited purpose of announcing their accredited status, and for use on reports that describe only testing and calibration within the scope of accreditation. NVLAP reserves the right to control the quality of the use of the NVLAP term, logo, and symbol. • Annex A (normative) and Annex B (informative) have been added. This handbook is also available on the NVLAP web site (http://www.nist.gov/nvlap).
Forensic Science Error Management Symposium, Jul 1, 2015
Microscopy and Microanalysis
MRS Proceedings, 1996
Nanophase TiO{sub 2} (n-TiO{sub 2}) particles were generated in a flame burner system under three... more Nanophase TiO{sub 2} (n-TiO{sub 2}) particles were generated in a flame burner system under three experimental conditions. Selected individual nanoparticles were identified and characterized using selected area electron diffraction, bright-field and, in some cases, dark-field imaging to determine morphology and microstructural features. Previously unknown TiO{sub 2} particles with unusual central features were identified as rutile. Electron holography was used to characterize the central features which were found to be consistent with voids. More extensive characterization of individual particles may lead to improved understanding of n-TiO{sub 2} nucleation and growth.
ABSTRACTNanophase TiO2 (n-TiO2) particles were generated in a flame burner system under three exp... more ABSTRACTNanophase TiO2 (n-TiO2) particles were generated in a flame burner system under three experimental conditions. Selected individual nanoparticles were identified and characterized using selected area electron diffraction, bright-field and, in some cases, dark-field imaging to determine morphology and microstructural features. Previously unknown TiO2 particles with unusual central features were identified as rutile. Electron holography was used to characterize the central features which were found to be consistent with voids. More extensive characterization of individual particles may lead to improved understanding of n-TiO2 nucleation and growth.
Microscopy and Microanalysis
Accurate characterization of electron diffraction patterns can be tedious, which encourages devel... more Accurate characterization of electron diffraction patterns can be tedious, which encourages development of computer assisted tools and methods. We developed a spot measurement tool to characterize rapidly arrays of diffraction spots that are characteristic of a single crystal, and to measure precisely the d-spacing values for individual spots. The spot tool determines these vectors for averaged measurements from many spots in a digital image of the diffraction pattern. Previously we developed automated methods for spot pattern analysis. Why make an operator-assisted tool? This tool is faster than either our automated or entirely manual methods, and it allows assessment of the quality of the data at the beginning of the analysis.It is easy to see regular patterns of spots in a zone axis diffraction pattern (Fig. 1.1). An operator guides the initial calculations by adjusting an array of circles to approximately cover the spots in the pattern to be analyzed.
Microscopy and Microanalysis
AIP Conference Proceedings
Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanaly... more Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the microelectronics industry as reference standards. Specimens with nominal compositions of 14 at. %, 6.5 at. %, and 3.5 at. % Ge were
Microscopy and Microanalysis, Aug 1, 2002
Microscopy and Microanalysis, Aug 1, 2003
MRS Proceedings, 1990
ABSTRACTFor studies of particles suspended in air or water, material is commonly deposited onto m... more ABSTRACTFor studies of particles suspended in air or water, material is commonly deposited onto membrane filters. Submicrometer particles collected in or on the surface of the filters can be prepared for analysis by TEM by extraction replica methods. To identify the problems and artifacts generated during the preparation process, evaluations were made of replicas prepared internally at NIST and prepared by laboratories involved in the analysis of air-collected asbestos. Problems or artifacts that could affect the counting and analysis of asbestos particles were identified and characterized. Results of evaluations of replicas prepared by eighteen laboratories in an interlaboratory study are summarized.
MRS Proceedings, 1999
ABSTRACTRutile nanoparticles containing voids or cavities have been characterized using transmiss... more ABSTRACTRutile nanoparticles containing voids or cavities have been characterized using transmission electron microscopy. The general morphology of the voids has been determined from images of nanoparticles in different orientations. In general, the longest dimension is along the c axis of rutile. Many of the voids show a prismatic morphology with dipyramid terminations. The prism consists of primarily four {110} faces with rounded or faceted comers between the primary faces. The pyramidal terminations can appear ovoid or faceted. A major facet plane of the pyramids is (101). A model consistent with the morphology of many voids in rutile nanoparticles is proposed.
Science (New York, N.Y.), Jan 14, 1983
Platy intergrowths of crystalline todorokite are associated with biogenic debris in the cores of ... more Platy intergrowths of crystalline todorokite are associated with biogenic debris in the cores of manganese nodules from a site in the Pacific Ocean. Analyses by electron diffraction and transmission electron microscopy demonstrate that this material is composed of tunnels of chains of linked MnO(6) octahedra. The chemical composition, morphology, and stability of the todorokite differ from those of nickel-and copper-rich manganese oxides in nodules that have been identified as todorokite or buserite in earlier investigations.