David Field | Washington State University (original) (raw)

Papers by David Field

Research paper thumbnail of Friction stir welding/processing of metals and alloys: A comprehensive review on microstructural evolution

Progress in Materials Science, 2021

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Research paper thumbnail of Quantifying the effects of tempering on individual phase properties of DP980 steel with nanoindentation

Materials Science and Engineering: A, 2016

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Research paper thumbnail of Crystallographic characterization of interconnects by orientation mapping in the SEM

The 1998 international conference on characterization and metrology for ULSI technology, 1998

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Research paper thumbnail of Effect of Dynamic Loading Rate on the Uniaxial Dynamic Tensile Response in Commercially Pure 1050 Aluminum

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Research paper thumbnail of Analysis of Grain Boundary Cavitation Damage in Copper

Textures and Microstructures, 1991

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Research paper thumbnail of Investigating the microstructure-reliability relationship in Cu damascene lines

Scripta Materialia, 2001

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Research paper thumbnail of SEM-Based Electron Tomography of Turfs Comprised of Lineal Structures

Microscopy and Microanalysis, 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tenness... more Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Research paper thumbnail of Heterogeneity of intergranular damage in Copper Crept in Plane-Strain Tension

Metallurgical Transactions A, 1992

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Research paper thumbnail of Microstructural evolution and observed stress response during hot deformation of 5005 and 6022 Al alloys

Materials Science and Engineering: A, 2006

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Research paper thumbnail of Study of Geometrically Necessary Dislocations of a Partially Recrystallized Aluminum Alloy Using 2D EBSD

Microscopy and Microanalysis, 2019

During recrystallization, the growth of fresh grains initiated within a deformed microstructure c... more During recrystallization, the growth of fresh grains initiated within a deformed microstructure causes dramatic changes in the dislocation structure and density of a heavily deformed matrix. In this paper, the microstructure of a cold rolled and partially recrystallized Al-Mg alloy (AA5052) was studied via electron backscattered diffraction (EBSD) analysis. The structure and density of the geometrically necessary dislocations (GNDs) were predicted using a combination of continuum mechanics and dislocation theory. Accordingly, the Nye dislocation tensor, which determines the GND structure, was estimated by calculation of the lattice curvature. To do so, five components of the Nye dislocation tensor were directly calculated from the local orientation of surface points of the specimen, which was determined by two-dimensional EBSD. The remaining components of GNDs were determined by minimizing a normalized Hamiltonian equation based on dislocation energy. The results show the eliminatio...

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Research paper thumbnail of Analysis of Multiphase Materials Using Electron Backscatter Diffraction

Microscopy and Microanalysis, 1997

Image analysis techniques coupled with crystallography computer codes have been used to index ele... more Image analysis techniques coupled with crystallography computer codes have been used to index electron backscatter diffraction patterns (EBSPs). The ability to automatically obtain the crystallographic orientation from EBSPs coupled with computer control of the electron beam (or stage) in a scanning electron microscope (SEM) provides a much more complete description of the spatial distribution of crystallographic orientation in polycrystalline materials than has been previously attainable using conventional metallography techniques. Orientation data obtained using this technique can be used to form images reflecting the spatial arrangement of crystallographic orientation in a microstructure. Such images enable the topological features of a microstructure to be linked with the orientation characteristics. The formation of these images, as well as the data collection technique, is sometimes termed Orientation Imaging Microscopy (OIM). The utility of this technique for exploring the pr...

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Research paper thumbnail of Advanced Software Capabilities for Automated EBSD

Electron Backscatter Diffraction in Materials Science, 2000

Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter K... more Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter Kikuchi diffraction in the scanning electron microscope (SEM). The first commercial system was produced by Moon and Harris of Custom Camera Designs in 1984 and was an outgrowth of the system designed by Dingley at the University of Bristol. This design was later provided to both Oxford Instruments and Ris0 National Laboratory out of which the OPAL™ and HKL™ systems evolved. The first fully automated EBSD system capable of automatic indexing of EBSD patterns and subsequent mapping of the spatial distribution of crystallographic orientation was introduced by Wright (1992). The term Orientation Imaging Microscopy or OIM™ was coined to describe this automated technique for forming images by mapping orientation data obtained from automated EBSD (Adams et al., 1993). Dingley and Adams co-founded TSL (or TexSEM Laboratories) in 1994 to produce the first commercial automated EBSD system based on the system developed by the group at Yale University (Adams, Wright, and Kunze). TSL adopted the name OIM™ for its automated EBSD products. Much of what was included in the original TSL system has become a standard for modern EBSD systems.

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Research paper thumbnail of The effect of cold deformation on the kinetics of the beta

Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science, 2005

Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed... more Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed and undeformed conditions were investigated by means of differential scanning calorimetry (DSC). Transmission electron microscopy (TEM) analysis on predeformed samples was also performed to study the effect of deformation on beta" precipitates. It was found that the introduction of dislocations changes the precipitate type

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Research paper thumbnail of Relationship Between Structure and Electromigration Characteristics of Pure Aluminum Films

MRS Proceedings, 1997

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Research paper thumbnail of Dislocation density based crystal plasticity finite element simulation of Al bicrystal with grain boundary effects

MRS Proceedings, 2014

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Research paper thumbnail of Texture and Grain Boundary Structure Dependence of Hillock Formation in Thin Metal Films

MRS Proceedings, 1998

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Research paper thumbnail of In situ observation of orientation changes on metallic surfaces

Proceedings ... annual meeting, Electron Microscopy Society of America, Aug 13, 1995

The characterization of crystalline aggregates by the crystallographic orientations of their grai... more The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.

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Research paper thumbnail of Automatic analysis of Kikuchi diffraction patterns

Proceedings ... annual meeting, Electron Microscopy Society of America, 1994

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scan... more Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

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Research paper thumbnail of Scalar Measures of Texture Heterogeneity

Materials Science Forum, Sep 1, 2005

Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www... more Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www.scientific.net © (2005) Trans Tech Publications, Switzerland doi:10.4028/www.scientific.net/MSF.495-497.207 ... All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP, www.ttp.net. (ID: 66.249.66.16-19/04/12,06:03:28) ... Textures of Materials - ICOTOM 14 10.4028/www.scientific.net/MSF.495-497

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Research paper thumbnail of Transmission electron microscopy and differential scanning calorimetry studies on the precipitation sequence in an Al–Mg–Si alloy: AA6022

Journal of Materials Research, Oct 1, 2005

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Research paper thumbnail of Friction stir welding/processing of metals and alloys: A comprehensive review on microstructural evolution

Progress in Materials Science, 2021

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Research paper thumbnail of Quantifying the effects of tempering on individual phase properties of DP980 steel with nanoindentation

Materials Science and Engineering: A, 2016

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Research paper thumbnail of Crystallographic characterization of interconnects by orientation mapping in the SEM

The 1998 international conference on characterization and metrology for ULSI technology, 1998

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Research paper thumbnail of Effect of Dynamic Loading Rate on the Uniaxial Dynamic Tensile Response in Commercially Pure 1050 Aluminum

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Analysis of Grain Boundary Cavitation Damage in Copper

Textures and Microstructures, 1991

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Investigating the microstructure-reliability relationship in Cu damascene lines

Scripta Materialia, 2001

Bookmarks Related papers MentionsView impact

Research paper thumbnail of SEM-Based Electron Tomography of Turfs Comprised of Lineal Structures

Microscopy and Microanalysis, 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tenness... more Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Research paper thumbnail of Heterogeneity of intergranular damage in Copper Crept in Plane-Strain Tension

Metallurgical Transactions A, 1992

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Research paper thumbnail of Microstructural evolution and observed stress response during hot deformation of 5005 and 6022 Al alloys

Materials Science and Engineering: A, 2006

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Study of Geometrically Necessary Dislocations of a Partially Recrystallized Aluminum Alloy Using 2D EBSD

Microscopy and Microanalysis, 2019

During recrystallization, the growth of fresh grains initiated within a deformed microstructure c... more During recrystallization, the growth of fresh grains initiated within a deformed microstructure causes dramatic changes in the dislocation structure and density of a heavily deformed matrix. In this paper, the microstructure of a cold rolled and partially recrystallized Al-Mg alloy (AA5052) was studied via electron backscattered diffraction (EBSD) analysis. The structure and density of the geometrically necessary dislocations (GNDs) were predicted using a combination of continuum mechanics and dislocation theory. Accordingly, the Nye dislocation tensor, which determines the GND structure, was estimated by calculation of the lattice curvature. To do so, five components of the Nye dislocation tensor were directly calculated from the local orientation of surface points of the specimen, which was determined by two-dimensional EBSD. The remaining components of GNDs were determined by minimizing a normalized Hamiltonian equation based on dislocation energy. The results show the eliminatio...

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Analysis of Multiphase Materials Using Electron Backscatter Diffraction

Microscopy and Microanalysis, 1997

Image analysis techniques coupled with crystallography computer codes have been used to index ele... more Image analysis techniques coupled with crystallography computer codes have been used to index electron backscatter diffraction patterns (EBSPs). The ability to automatically obtain the crystallographic orientation from EBSPs coupled with computer control of the electron beam (or stage) in a scanning electron microscope (SEM) provides a much more complete description of the spatial distribution of crystallographic orientation in polycrystalline materials than has been previously attainable using conventional metallography techniques. Orientation data obtained using this technique can be used to form images reflecting the spatial arrangement of crystallographic orientation in a microstructure. Such images enable the topological features of a microstructure to be linked with the orientation characteristics. The formation of these images, as well as the data collection technique, is sometimes termed Orientation Imaging Microscopy (OIM). The utility of this technique for exploring the pr...

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Advanced Software Capabilities for Automated EBSD

Electron Backscatter Diffraction in Materials Science, 2000

Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter K... more Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter Kikuchi diffraction in the scanning electron microscope (SEM). The first commercial system was produced by Moon and Harris of Custom Camera Designs in 1984 and was an outgrowth of the system designed by Dingley at the University of Bristol. This design was later provided to both Oxford Instruments and Ris0 National Laboratory out of which the OPAL™ and HKL™ systems evolved. The first fully automated EBSD system capable of automatic indexing of EBSD patterns and subsequent mapping of the spatial distribution of crystallographic orientation was introduced by Wright (1992). The term Orientation Imaging Microscopy or OIM™ was coined to describe this automated technique for forming images by mapping orientation data obtained from automated EBSD (Adams et al., 1993). Dingley and Adams co-founded TSL (or TexSEM Laboratories) in 1994 to produce the first commercial automated EBSD system based on the system developed by the group at Yale University (Adams, Wright, and Kunze). TSL adopted the name OIM™ for its automated EBSD products. Much of what was included in the original TSL system has become a standard for modern EBSD systems.

Bookmarks Related papers MentionsView impact

Research paper thumbnail of The effect of cold deformation on the kinetics of the beta

Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science, 2005

Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed... more Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed and undeformed conditions were investigated by means of differential scanning calorimetry (DSC). Transmission electron microscopy (TEM) analysis on predeformed samples was also performed to study the effect of deformation on beta" precipitates. It was found that the introduction of dislocations changes the precipitate type

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Relationship Between Structure and Electromigration Characteristics of Pure Aluminum Films

MRS Proceedings, 1997

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Dislocation density based crystal plasticity finite element simulation of Al bicrystal with grain boundary effects

MRS Proceedings, 2014

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Texture and Grain Boundary Structure Dependence of Hillock Formation in Thin Metal Films

MRS Proceedings, 1998

Bookmarks Related papers MentionsView impact

Research paper thumbnail of In situ observation of orientation changes on metallic surfaces

Proceedings ... annual meeting, Electron Microscopy Society of America, Aug 13, 1995

The characterization of crystalline aggregates by the crystallographic orientations of their grai... more The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Automatic analysis of Kikuchi diffraction patterns

Proceedings ... annual meeting, Electron Microscopy Society of America, 1994

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scan... more Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Scalar Measures of Texture Heterogeneity

Materials Science Forum, Sep 1, 2005

Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www... more Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www.scientific.net © (2005) Trans Tech Publications, Switzerland doi:10.4028/www.scientific.net/MSF.495-497.207 ... All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP, www.ttp.net. (ID: 66.249.66.16-19/04/12,06:03:28) ... Textures of Materials - ICOTOM 14 10.4028/www.scientific.net/MSF.495-497

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Research paper thumbnail of Transmission electron microscopy and differential scanning calorimetry studies on the precipitation sequence in an Al–Mg–Si alloy: AA6022

Journal of Materials Research, Oct 1, 2005

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