David Field | Washington State University (original) (raw)

Papers by David Field

Progress in Materials Science, 2021

This is a PDF file of an article that has undergone enhancements after acceptance, such as the ad... more This is a PDF file of an article that has undergone enhancements after acceptance, such as the addition of a cover page and metadata, and formatting for readability, but it is not yet the definitive version of record. This version will undergo additional copyediting, typesetting and review before it is published in its final form, but we are providing this version to give early visibility of the article. Please note that, during the production process, errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.

Materials Science and Engineering: A, 2016

Tempering treatment is conducted on a commercial dual phase (DP) 980 steel at 250 ℃ and 400 ℃ for... more Tempering treatment is conducted on a commercial dual phase (DP) 980 steel at 250 ℃ and 400 ℃ for 60 minutes each. Ferrite and martensite grains are distinguished using electron backscatter diffraction (EBSD) and scanning probe microscopy (SPM), and the martensite volume fractions (MVF) are determined based on the image quality (IQ) map. Indentation tests combined with a newly developed inverse method are used to obtain the individual phase flow properties in each sample. The results show that, i) tempering significantly reduces martensite yield strength, while it slightly reduces the ferrite yield strength; ii) tempering temperature has a more significant influence on the work hardening exponent of ferrite than that of martensite. As a validation, a simple rule-of-mixtures is used to verify the above-predicted individual phase flow stresses with the experimentally obtained overall true stress vs. true strain curves.

The 1998 international conference on characterization and metrology for ULSI technology, 1998

We show in this paper how electron backscatter diffraction and orientation mapping within a scann... more We show in this paper how electron backscatter diffraction and orientation mapping within a scanning electron microscope can be used to measure local variations in crystallographic texture and grain boundary structure in interconnects. The reliability-limiting phenomena of stress voiding and electromigration are two examples of interconnect failure modes that depend strongly on local crystallographic structure. Several analysis examples are presented to show the utility of this technique for characterization of local microstructures in both copper-and aluminum-based lines. The advantages of a local measurement technique over a global texture method for orientation determination became immediately apparent in these investigations. This local approach to characterizing crystallography is expected to play an even larger role in technologies such as damascene or lift-off processing, where lines are deposited directly into precisely-defined geometries. Particularly in these more advanced processing technologies, one cannot extrapolate measurements of blanket film structure and properties to the case of narrow lines.

State University-A series of plate impact experiments were conducted to investigate the effect of... more State University-A series of plate impact experiments were conducted to investigate the effect of dynamic loading rate on the uniaxial dynamic tensile response of commercially pure 1050 aluminum. The loading rate (kinetic effect) was varied by altering the shock-wave shape, while the total defect density loaded in dynamic tension was held constant (spatial effect). The maximum tensile stress magnitude was held constant for all experiments in order to solely examine the effects of dynamic loading rate. Samples were soft recovered and analyzed via Electron Backscatter Diffraction (EBSD) to correlate damage to microstructural features. An optical velocimetry (VISAR) trace from the free surface was utilized to correlate the effects of damage growth rate observed through EBSD to changes in free surface velocity pull back rate. Results indicate as the dynamic tensile evolution rate was increased, a transition occurs from slow damage mechanisms of individual void nucleation and growth, to a fast mechanism of lattice curvature resulting in no observable macroscopic damage. These results suggest damage models must account for wave evolution in order to provide a robust predictive capability.

Textures and Microstructures, 1991

The interface damage function (IDF) defining the fraction of damage on crystallite interfaces in ... more The interface damage function (IDF) defining the fraction of damage on crystallite interfaces in a polycrystalline material 1 is extended to include functional dependence upon individual crystallite lattice orientation of grains composing a boundary. The material studied was OFHC copper crept at 10 MPa and 0.6 Tin. Major peaks in the IDF were found through a series of projections of the eight-dimensional domain of the function. A maximum value of 0.95 was found for the IDF.

Scripta Materialia, 2001

The present work focuses upon characterizing the microstructures of Cu damascene lines processed ... more The present work focuses upon characterizing the microstructures of Cu damascene lines processed using different bath chemistries and correlating the differences in microstructure with reliability of the test structures as determined from accelerated electromigration tests. Both, microstructure and electromigration lifetimes of Cu damascene lines can be altered substantially.

Microscopy and Microanalysis, 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tenness... more Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Metallurgical Transactions A, 1992

An interface damage function (IDF), which statistically describes the area fraction of interface ... more An interface damage function (IDF), which statistically describes the area fraction of interface damage as a function of up to eight parameters defining crystallite interfaces, was determined for commercial purity copper specimens crept in plane strain tension. The IDF was determined from stereological parameters measured on plane sections cut through damaged specimens. The eight-dimensional space of the function was investigated by analyzing two-dimensional projections of the complete domain. Certain "special" interfaces were observed to damage preferentially. A low planar density of atoms near crystallite interfaces apparently increased the propensity for the occurrence of damage. Other microstructural mechanisms contributing to the observed heterogeneous distribution of damage are also considered.

Materials Science and Engineering: A, 2006

A proper understanding of the relationships that connect processing conditions, microstructural e... more A proper understanding of the relationships that connect processing conditions, microstructural evolution and mechanical properties is important for any materials scientist to improve productivity and product quality. The objective of this work is to experimentally and statistically analyze the effect of physically measurable features of the starting microstructure on the yield stress of 6022 Al alloy. Quantitative parameters obtained from microstructure characterization and stress analysis were analyzed by a multiple regression analysis technique to determine the relative influence of various microstructural parameters on the observed stress response. The geometrically necessary dislocation (GND) density was determined to be the most important measured parameter affecting the yield stress. Experimental and statistical analysis showed a linear relationship between the yield stress and square root of the GND density.

Microscopy and Microanalysis, 2019

During recrystallization, the growth of fresh grains initiated within a deformed microstructure c... more During recrystallization, the growth of fresh grains initiated within a deformed microstructure causes dramatic changes in the dislocation structure and density of a heavily deformed matrix. In this paper, the microstructure of a cold rolled and partially recrystallized Al-Mg alloy (AA5052) was studied via electron backscattered diffraction (EBSD) analysis. The structure and density of the geometrically necessary dislocations (GNDs) were predicted using a combination of continuum mechanics and dislocation theory. Accordingly, the Nye dislocation tensor, which determines the GND structure, was estimated by calculation of the lattice curvature. To do so, five components of the Nye dislocation tensor were directly calculated from the local orientation of surface points of the specimen, which was determined by two-dimensional EBSD. The remaining components of GNDs were determined by minimizing a normalized Hamiltonian equation based on dislocation energy. The results show the eliminatio...

$Research paper thumbnail of Analysis of Multiphase Materials Using Electron Backscatter Diffraction$

Microscopy and Microanalysis, 1997

Image analysis techniques coupled with crystallography computer codes have been used to index ele... more Image analysis techniques coupled with crystallography computer codes have been used to index electron backscatter diffraction patterns (EBSPs). The ability to automatically obtain the crystallographic orientation from EBSPs coupled with computer control of the electron beam (or stage) in a scanning electron microscope (SEM) provides a much more complete description of the spatial distribution of crystallographic orientation in polycrystalline materials than has been previously attainable using conventional metallography techniques. Orientation data obtained using this technique can be used to form images reflecting the spatial arrangement of crystallographic orientation in a microstructure. Such images enable the topological features of a microstructure to be linked with the orientation characteristics. The formation of these images, as well as the data collection technique, is sometimes termed Orientation Imaging Microscopy (OIM). The utility of this technique for exploring the pr...

Electron Backscatter Diffraction in Materials Science, 2000

Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter K... more Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter Kikuchi diffraction in the scanning electron microscope (SEM). The first commercial system was produced by Moon and Harris of Custom Camera Designs in 1984 and was an outgrowth of the system designed by Dingley at the University of Bristol. This design was later provided to both Oxford Instruments and Ris0 National Laboratory out of which the OPAL™ and HKL™ systems evolved. The first fully automated EBSD system capable of automatic indexing of EBSD patterns and subsequent mapping of the spatial distribution of crystallographic orientation was introduced by Wright (1992). The term Orientation Imaging Microscopy or OIM™ was coined to describe this automated technique for forming images by mapping orientation data obtained from automated EBSD (Adams et al., 1993). Dingley and Adams co-founded TSL (or TexSEM Laboratories) in 1994 to produce the first commercial automated EBSD system based on the system developed by the group at Yale University (Adams, Wright, and Kunze). TSL adopted the name OIM™ for its automated EBSD products. Much of what was included in the original TSL system has become a standard for modern EBSD systems.

Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science, 2005

Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed... more Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed and undeformed conditions were investigated by means of differential scanning calorimetry (DSC). Transmission electron microscopy (TEM) analysis on predeformed samples was also performed to study the effect of deformation on beta" precipitates. It was found that the introduction of dislocations changes the precipitate type

MRS Proceedings, 1997

Aluminum films were deposited from a high purity aluminum source by the self-ion assisted techniq... more Aluminum films were deposited from a high purity aluminum source by the self-ion assisted technique onto oxidized silicon wafers with TiN sub-layers. The ions were accelerated toward the substrate by potentials of 0, 3 and 6 kV. The films were patterned into strips 670 Pm long and 8 pm wide using photo-lithographic procedures and wet etching. Average drift velocities were measured in the films tested under electromigration conditions. Electromigration activation energy was obtained for the films. It was found that electromigration activation energy increased with the acceleration potential. The strength of the (11) fiber texture, however, decreased with the acceleration potential. Therefore, the weaker textures resulted in higher electromigration activation energies. These results can be explained in terms of grain boundary structure, which controls electromigration behavior. By using orientation imaging microscopy to characterize the structures, it was shown that the weaker textured specimens contained a high fraction of low angle and low diffusivity grain boundaries.

MRS Proceedings, 1998

The development of hillocks on metal films during annealing is detrimental to downstream processi... more The development of hillocks on metal films during annealing is detrimental to downstream processing of integrated circuit structures. This work focuses upon the local character of texture and grain boundary structure near hillocks in metal films. It is apparent from the results that local grain boundary structure and texture strength are important parameters in identifying locations in the films that are preferentially susceptible to failure under given conditions. Results in aluminum and platinum films indicate that non-(11) oriented grains preferentially contain hillocks. In addition, (11) oriented grains with boundaries characterized by high angle rotations about random axes are prone to hillock formation.

Proceedings ... annual meeting, Electron Microscopy Society of America, Aug 13, 1995

The characterization of crystalline aggregates by the crystallographic orientations of their grai... more The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.

$Research paper thumbnail of Automatic analysis of Kikuchi diffraction patterns$

Proceedings ... annual meeting, Electron Microscopy Society of America, 1994

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scan... more Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

Materials Science Forum, Sep 1, 2005

Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www... more Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www.scientific.net © (2005) Trans Tech Publications, Switzerland doi:10.4028/www.scientific.net/MSF.495-497.207 ... All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP, www.ttp.net. (ID: 66.249.66.16-19/04/12,06:03:28) ... Textures of Materials - ICOTOM 14 10.4028/www.scientific.net/MSF.495-497

Journal of Materials Research, Oct 1, 2005

The precipitate sequence in a 6022 aluminum alloy was investigated by means of differential scann... more The precipitate sequence in a 6022 aluminum alloy was investigated by means of differential scanning calorimetry (DSC), transmission electron microscopy, and Vickers hardness measurements. The solutiontreated samples were quenched and then immediately subjected to DSC and isothermal aging experiments. It was observed that in the early stages of aging there are some unknown small precipitates that form prior to the formation of â" precipitates. Studies on isothermally aged and DSC heated samples suggest that some of the â" needles transform during growth to lath-shaped precipitates. An alternative precipitation sequence for AA6022 is proposed.