David Field | Washington State University (original) (raw)
Papers by David Field
Progress in Materials Science, 2021
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Materials Science and Engineering: A, 2016
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The 1998 international conference on characterization and metrology for ULSI technology, 1998
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Textures and Microstructures, 1991
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Scripta Materialia, 2001
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Microscopy and Microanalysis, 2011
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tenness... more Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
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Metallurgical Transactions A, 1992
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Materials Science and Engineering: A, 2006
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Microscopy and Microanalysis, 2019
During recrystallization, the growth of fresh grains initiated within a deformed microstructure c... more During recrystallization, the growth of fresh grains initiated within a deformed microstructure causes dramatic changes in the dislocation structure and density of a heavily deformed matrix. In this paper, the microstructure of a cold rolled and partially recrystallized Al-Mg alloy (AA5052) was studied via electron backscattered diffraction (EBSD) analysis. The structure and density of the geometrically necessary dislocations (GNDs) were predicted using a combination of continuum mechanics and dislocation theory. Accordingly, the Nye dislocation tensor, which determines the GND structure, was estimated by calculation of the lattice curvature. To do so, five components of the Nye dislocation tensor were directly calculated from the local orientation of surface points of the specimen, which was determined by two-dimensional EBSD. The remaining components of GNDs were determined by minimizing a normalized Hamiltonian equation based on dislocation energy. The results show the eliminatio...
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Microscopy and Microanalysis, 1997
Image analysis techniques coupled with crystallography computer codes have been used to index ele... more Image analysis techniques coupled with crystallography computer codes have been used to index electron backscatter diffraction patterns (EBSPs). The ability to automatically obtain the crystallographic orientation from EBSPs coupled with computer control of the electron beam (or stage) in a scanning electron microscope (SEM) provides a much more complete description of the spatial distribution of crystallographic orientation in polycrystalline materials than has been previously attainable using conventional metallography techniques. Orientation data obtained using this technique can be used to form images reflecting the spatial arrangement of crystallographic orientation in a microstructure. Such images enable the topological features of a microstructure to be linked with the orientation characteristics. The formation of these images, as well as the data collection technique, is sometimes termed Orientation Imaging Microscopy (OIM). The utility of this technique for exploring the pr...
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Electron Backscatter Diffraction in Materials Science, 2000
Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter K... more Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter Kikuchi diffraction in the scanning electron microscope (SEM). The first commercial system was produced by Moon and Harris of Custom Camera Designs in 1984 and was an outgrowth of the system designed by Dingley at the University of Bristol. This design was later provided to both Oxford Instruments and Ris0 National Laboratory out of which the OPAL™ and HKL™ systems evolved. The first fully automated EBSD system capable of automatic indexing of EBSD patterns and subsequent mapping of the spatial distribution of crystallographic orientation was introduced by Wright (1992). The term Orientation Imaging Microscopy or OIM™ was coined to describe this automated technique for forming images by mapping orientation data obtained from automated EBSD (Adams et al., 1993). Dingley and Adams co-founded TSL (or TexSEM Laboratories) in 1994 to produce the first commercial automated EBSD system based on the system developed by the group at Yale University (Adams, Wright, and Kunze). TSL adopted the name OIM™ for its automated EBSD products. Much of what was included in the original TSL system has become a standard for modern EBSD systems.
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Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science, 2005
Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed... more Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed and undeformed conditions were investigated by means of differential scanning calorimetry (DSC). Transmission electron microscopy (TEM) analysis on predeformed samples was also performed to study the effect of deformation on beta" precipitates. It was found that the introduction of dislocations changes the precipitate type
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MRS Proceedings, 1997
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MRS Proceedings, 2014
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MRS Proceedings, 1998
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Proceedings ... annual meeting, Electron Microscopy Society of America, Aug 13, 1995
The characterization of crystalline aggregates by the crystallographic orientations of their grai... more The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.
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Proceedings ... annual meeting, Electron Microscopy Society of America, 1994
Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scan... more Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.
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Materials Science Forum, Sep 1, 2005
Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www... more Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www.scientific.net © (2005) Trans Tech Publications, Switzerland doi:10.4028/www.scientific.net/MSF.495-497.207 ... All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP, www.ttp.net. (ID: 66.249.66.16-19/04/12,06:03:28) ... Textures of Materials - ICOTOM 14 10.4028/www.scientific.net/MSF.495-497
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Journal of Materials Research, Oct 1, 2005
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Progress in Materials Science, 2021
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Materials Science and Engineering: A, 2016
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The 1998 international conference on characterization and metrology for ULSI technology, 1998
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Bookmarks Related papers MentionsView impact
Textures and Microstructures, 1991
Bookmarks Related papers MentionsView impact
Scripta Materialia, 2001
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Microscopy and Microanalysis, 2011
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tenness... more Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Bookmarks Related papers MentionsView impact
Metallurgical Transactions A, 1992
Bookmarks Related papers MentionsView impact
Materials Science and Engineering: A, 2006
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Microscopy and Microanalysis, 2019
During recrystallization, the growth of fresh grains initiated within a deformed microstructure c... more During recrystallization, the growth of fresh grains initiated within a deformed microstructure causes dramatic changes in the dislocation structure and density of a heavily deformed matrix. In this paper, the microstructure of a cold rolled and partially recrystallized Al-Mg alloy (AA5052) was studied via electron backscattered diffraction (EBSD) analysis. The structure and density of the geometrically necessary dislocations (GNDs) were predicted using a combination of continuum mechanics and dislocation theory. Accordingly, the Nye dislocation tensor, which determines the GND structure, was estimated by calculation of the lattice curvature. To do so, five components of the Nye dislocation tensor were directly calculated from the local orientation of surface points of the specimen, which was determined by two-dimensional EBSD. The remaining components of GNDs were determined by minimizing a normalized Hamiltonian equation based on dislocation energy. The results show the eliminatio...
Bookmarks Related papers MentionsView impact
Microscopy and Microanalysis, 1997
Image analysis techniques coupled with crystallography computer codes have been used to index ele... more Image analysis techniques coupled with crystallography computer codes have been used to index electron backscatter diffraction patterns (EBSPs). The ability to automatically obtain the crystallographic orientation from EBSPs coupled with computer control of the electron beam (or stage) in a scanning electron microscope (SEM) provides a much more complete description of the spatial distribution of crystallographic orientation in polycrystalline materials than has been previously attainable using conventional metallography techniques. Orientation data obtained using this technique can be used to form images reflecting the spatial arrangement of crystallographic orientation in a microstructure. Such images enable the topological features of a microstructure to be linked with the orientation characteristics. The formation of these images, as well as the data collection technique, is sometimes termed Orientation Imaging Microscopy (OIM). The utility of this technique for exploring the pr...
Bookmarks Related papers MentionsView impact
Electron Backscatter Diffraction in Materials Science, 2000
Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter K... more Venables (1973) coined the term electron backscatter diffraction (EBSD) to describe backscatter Kikuchi diffraction in the scanning electron microscope (SEM). The first commercial system was produced by Moon and Harris of Custom Camera Designs in 1984 and was an outgrowth of the system designed by Dingley at the University of Bristol. This design was later provided to both Oxford Instruments and Ris0 National Laboratory out of which the OPAL™ and HKL™ systems evolved. The first fully automated EBSD system capable of automatic indexing of EBSD patterns and subsequent mapping of the spatial distribution of crystallographic orientation was introduced by Wright (1992). The term Orientation Imaging Microscopy or OIM™ was coined to describe this automated technique for forming images by mapping orientation data obtained from automated EBSD (Adams et al., 1993). Dingley and Adams co-founded TSL (or TexSEM Laboratories) in 1994 to produce the first commercial automated EBSD system based on the system developed by the group at Yale University (Adams, Wright, and Kunze). TSL adopted the name OIM™ for its automated EBSD products. Much of what was included in the original TSL system has become a standard for modern EBSD systems.
Bookmarks Related papers MentionsView impact
Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science, 2005
Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed... more Kinetics of beta" precipitation in an Al-0.55 pct Mg-1.1 wt pct Si (AA6022) in both deformed and undeformed conditions were investigated by means of differential scanning calorimetry (DSC). Transmission electron microscopy (TEM) analysis on predeformed samples was also performed to study the effect of deformation on beta" precipitates. It was found that the introduction of dislocations changes the precipitate type
Bookmarks Related papers MentionsView impact
MRS Proceedings, 1997
Bookmarks Related papers MentionsView impact
MRS Proceedings, 2014
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MRS Proceedings, 1998
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Proceedings ... annual meeting, Electron Microscopy Society of America, Aug 13, 1995
The characterization of crystalline aggregates by the crystallographic orientations of their grai... more The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.
Bookmarks Related papers MentionsView impact
Proceedings ... annual meeting, Electron Microscopy Society of America, 1994
Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scan... more Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.
Bookmarks Related papers MentionsView impact
Materials Science Forum, Sep 1, 2005
Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www... more Materials Science Forum Vols. 495-497 (2005) pp 207-212 Online available since 2005/Sep/15 at www.scientific.net © (2005) Trans Tech Publications, Switzerland doi:10.4028/www.scientific.net/MSF.495-497.207 ... All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP, www.ttp.net. (ID: 66.249.66.16-19/04/12,06:03:28) ... Textures of Materials - ICOTOM 14 10.4028/www.scientific.net/MSF.495-497
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Journal of Materials Research, Oct 1, 2005
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