Investigating a Hypothetical Semiconductor Laser Bar Using a Laser Diode Simulation/Emulation Tool Using Random Levels of Defects (original) (raw)

Investigating the Effect of Defects through Non-Radiative Recombination Centres in a Single Emitter Laser Bar using a Laser Diode Simulation/Emulation Tool

Philip Blewushie

Global Journal of Research In Engineering, 2013

View PDFchevron_right

By-emitter Emulation Enhancement Tool Using a Global Thermal Solver for the Degradation Emulation of a Calibrated 975 nm Tapered Laser Bar

Joseph Attachie

American Journal of Electrical and Electronic Engineering, 2013

View PDFchevron_right

Degradation model analysis of laser diodes

Ute Zeimer

Journal of Materials Science: Materials in Electronics, 2008

View PDFchevron_right

Automated Lifetime Measurement Facility for Laser Diodes

Chetan Panchal

View PDFchevron_right

A dynamic simulation model for semiconductor laser diodes

Xavier Fernando

CCECE 2003 - Canadian Conference on Electrical and Computer Engineering. Toward a Caring and Humane Technology (Cat. No.03CH37436), 2003

View PDFchevron_right

Simulation of semiconductor laser using circuit level modeling

CHEE LEONG TAN

View PDFchevron_right

Degradation of heterojunction laser diodes under electron beam irradiation

Radu Sporea

Photonics North 2004: Optical Components and Devices, 2004

View PDFchevron_right

Degradation of heterojunction laser diodes under electron beam irradiation

Radu Sporea

2004

View PDFchevron_right

Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approach

Marie-lise Flottes

2014

View PDFchevron_right

Power semiconductor laser diode arrays characterization

Giuseppe D'Angelo

Optics and Lasers in Engineering, 2003

View PDFchevron_right

Defect characterization of electrically degraded ZnSe based laser diodes

Roland Kröger

physica status solidi (a), 2004

View PDFchevron_right

Design and Simulation of Next-Generation High-Power, High-Brightness Laser Diodes

H. Wenzel, Slawomir Sujecki

IEEE Journal of Selected Topics in Quantum Electronics, 2000

View PDFchevron_right

Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980nm high-power laser diodes

Yannick Deshayes

Microelectronics Reliability, 2015

View PDFchevron_right

Semiconductor Diode Laser Dynamics

Randy Park

1981

View PDFchevron_right

A New Kinetics Defect Diffusion Model and the Critical Current Density of Semiconductor Laser Degradation

Jack Jia-Sheng

View PDFchevron_right

Modeling the optical processes in semiconductor lasers

Andreas Witzig

2002

View PDFchevron_right

Identification of some key parameters for photoelectric laser simulation of IC: an experimental approach

Kevin Sánchez

Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005.

View PDFchevron_right

A simpler method for life-testing laser diodes

Giovanni Martines

Microelectronics Reliability, 1999

View PDFchevron_right

Screening of high power laser diode bars in terms of stresses and thermal profiles

Tran Tien

2008

View PDFchevron_right

Degradation behavior and thermal properties of red (650 nm) high-power diode single emitters and laser bars - art. no. 645606

Martin Zorn, G. Erbert

2007

View PDFchevron_right

Active Defects Generated in Silicon by Laser Doping Process.pdf

Abdelfettah BARHDADI

View PDFchevron_right

Quasi-cw laser diode bar life tests

Michael Krainak

Laser-Induced Damage in Optical Materials: 1997, 1998

View PDFchevron_right

Laser Diode Beam Basics, Manipulations and Characterizations

Haiyin Sun

SpringerBriefs in Physics, 2012

View PDFchevron_right

Study of high-power GaAs-based laser diodes operation and failure by cross-sectional electrostatic force microscopy

Georgy Zegrya

View PDFchevron_right

Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam

C. Boit

IEEE Transactions on Device and Materials Reliability, 2007

View PDFchevron_right

A Spectroscopically Resolved Photo- and Electroluminescence Microscopy Technique for the Study of High-Power and High-Brightness Laser Diodes

John Noto

IEEE Transactions on Instrumentation and Measurement, 2005

View PDFchevron_right

Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

Paul Michael Petersen

Applied Physics Letters, 2009

View PDFchevron_right

Computer simulation of transient processes in DFB semiconductor lasers

Vilius Palenskis

Lithuanian Journal of Physics, 2007

View PDFchevron_right

Reliability of high performance 9xx-nm single emitter laser diodes

Paul Leisher

2010

View PDFchevron_right

Time resolved study of laser diode characteristics during pulsed operation

Daniel Hofstetter

View PDFchevron_right

A comprehensive equivalent circuit model for the study of thermal and spectral characteristics in laser diodes

Dr.Ganesh Madhan

Optik - International Journal for Light and Electron Optics, 2014

View PDFchevron_right

Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits

Raphael Camponogara Viera

View PDFchevron_right

Characterization and TCAD simulation of 90 nm technology transistors under continous photoelectric laser stimulation for failure analysis improvement

Mathieu Lisart

2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2012

View PDFchevron_right

Feedback-Induced Failure of High-Power Diode Lasers

susant patra

IEEE Journal of Quantum Electronics, 2018

View PDFchevron_right