Reliability studies of application specific integrated circuits operated at cryogenic temperature (original) (raw)
Related papers
Reliability studies of electronic components for the operation at cryogenic temperature
arXiv (Cornell University), 2019
CMOS reliability issues for emerging cryogenic Lunar electronics applications
Solid-State Electronics, 2006
IEEE Transactions on Nuclear Science, 2000
Testing and Characterization of Silicon Devices at Cryogenic Temperatures
2007
Cryogenic applications of commercial electronic components
Cryogenics, 2012
Microelectronics Journal, 2003
Reliability of flip chip assemblies subjected to extreme low temperatures
The Importance of Temporal and Spatial Temperature Gradients in IC Reliability Analysis
2012
Sensors, 2018
Characterization and Synthesis of Circuits at Extreme Low Temperatures
Genetic and Evolutionary Computation
Microelectronic reliability/temperature independence
Quality and Reliability Engineering International, 1991
2014
Evolvable Hardware System at Extreme Low Temperatures
Lecture Notes in Computer Science, 2005
High Temperature Experiments for Circuit Self-Recovery
Lecture Notes in Computer Science, 2004
Electronic Reliability Analysis Under Radiation Environment
Sensors and Materials, 2021
Electronic components and circuits for extreme temperature environments
2003
Electronics reliability methods for neutrinos telescopes: the KM3NeT case
Journal of Instrumentation, 2021
… Final Report, 2003 …, 2003
Investigation of the Characteristics of Cmos Ics at Low Temperatures
Instruments and Experimental Techniques, 1997
The influence of temperature on integrated circuit failure mechanisms
Quality and Reliability Engineering, 1992
ASME 2009 InterPACK Conference, Volume 1, 2009
Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC), 2010
Improving ICs reliability with high speed thermal mapping
Integration, 2018
Cold Electronics Development for the LBNE LAr TPC
Physics Procedia, 2012
IEEE Transactions on Nuclear Science, 2008
Device Modeling at Cryogenic Temperatures: Effects of Incomplete Ionization
Jeffrey Allnutt, Neil Goldsman, Martin Peckerar
IEEE Transactions on Electron Devices, 2007
Challenges in Reliability Assessment of Advanced CMOS Technologies
2007
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip
Microelectronics Reliability, 2008
Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics
1989