Phase differentiation via combined EBSD and XEDS (original) (raw)

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New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging

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Materials Science and Engineering A 524, 69-76 (2009), 2009

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The software packageANAELUfor X-ray diffraction analysis using two-dimensional patterns

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Quantitative information on the crystallographic orientation of the constituent grains in a polycrystalline microstructure is best characterized via electron backscatter diffraction

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P A Buffat

2000

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2014

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Outcomes of the International Union of Crystallography Commission on Powder Diffraction Round Robin on Quantitative Phase Analysis: samples 1 a to 1 h

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Band positions used for on-line crystallographic orientation determination from electron back scattering patterns. Discussion

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2003

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Sherry Mayo

2002

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A method for crystallographic texture investigations using standard x-ray equipment

Martin Rupich

Journal of Materials Research, 1998

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Method of X-Ray Diffraction Data Processing for Multiphase Materials with Low Phase Contents

I. V . Zhyganiuk

Ukrainian Journal of Physics, 2019

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Robustness of the quantitative phase analysis of X-ray diffraction data by the Rietveld method

Matthew Rowles

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Microscopy and Microanalysis, 1998

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Characterisation and Study of Compounds by Single Crystal X-ray Diffraction

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