Device under test (original) (raw)

About DBpedia

A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification.

Property Value
dbo:abstract Als Device Under Test (dt.: Prüfling), kurz DUT, wird vor allem in der elektrischen Mess- und Prüftechnik ein zu prüfendes Objekt bezeichnet. Das kann ein isolierter Bereich auf einem Wafer, ein einzelnes Bauteil, eine Baugruppe oder ein komplettes Gerät sein. Welche Funktionen des DUT geprüft werden, ist abhängig von seiner Art, den zu ermittelnden Testparametern oder Messwerten und den zur Verfügung stehenden Prüfmitteln und Messgeräten. Kann auch als Equipment Under Test (EUT) bezeichnet werden, das in Prüfberichten oft gebräuchlicher ist. Ebenso gebräuchlich ist die Bezeichnung Unit Under Test (UUT). (de) A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification. (en) テスト対象デバイス (テストたいしょうデバイス、英: device under test、DUT)とは、継続的な機能試験や較正を行う対象の機器のこと。試験は出荷前に行われることも、出荷後の製品ライフサイクルの後の方、つまり機器が元々の製品仕様に従って機能していることを確認するための、修理後に行われる試験の場合もある。 別の呼び方には業界によってさまざまな変種がある。以下は一例。 * DUT (Device under test) - 被試験デバイス、検査対象機、試験中の装置、被試験体、被検体、被測定物、測定対象 * EUT (Equipment under test) - 被試験機器 * UUT (Unit under test) - 被試験ユニット (ja) 被测器件（英語：device under test，DUT）或被测装置，又称在测单元或被测部件（unit under test，UUT），常用於表示正处於测试阶段的工业产品。 (zh)
dbo:wikiPageID 5102157 (xsd:integer)
dbo:wikiPageLength 2825 (xsd:nonNegativeInteger)
dbo:wikiPageRevisionID 1119285794 (xsd:integer)
dbo:wikiPageWikiLink dbr:Bed_of_nails_tester dbr:DUT_board dbr:Test_bench dbr:Wafer_(electronics) dbr:Die_(integrated_circuit) dbc:Environmental_testing dbc:Hardware_testing dbc:Product_testing dbc:Semiconductor_device_fabrication dbc:Electronic_engineering dbr:Zero_insertion_force dbr:Automatic_test_equipment dbc:Automatic_test_equipment dbr:Pogo_pin dbr:Printed_circuit_board dbr:System_under_test dbr:Product_testing dbr:Semiconductor_curve_tracer dbr:Packaged_part
dbp:wikiPageUsesTemplate dbt:Reflist dbt:Tech-stub
dct:subject dbc:Environmental_testing dbc:Hardware_testing dbc:Product_testing dbc:Semiconductor_device_fabrication dbc:Electronic_engineering dbc:Automatic_test_equipment
gold:hypernym dbr:Term
rdfs:comment A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification. (en) テスト対象デバイス (テストたいしょうデバイス、英: device under test、DUT)とは、継続的な機能試験や較正を行う対象の機器のこと。試験は出荷前に行われることも、出荷後の製品ライフサイクルの後の方、つまり機器が元々の製品仕様に従って機能していることを確認するための、修理後に行われる試験の場合もある。 別の呼び方には業界によってさまざまな変種がある。以下は一例。 * DUT (Device under test) - 被試験デバイス、検査対象機、試験中の装置、被試験体、被検体、被測定物、測定対象 * EUT (Equipment under test) - 被試験機器 * UUT (Unit under test) - 被試験ユニット (ja) 被测器件（英語：device under test，DUT）或被测装置，又称在测单元或被测部件（unit under test，UUT），常用於表示正处於测试阶段的工业产品。 (zh) Als Device Under Test (dt.: Prüfling), kurz DUT, wird vor allem in der elektrischen Mess- und Prüftechnik ein zu prüfendes Objekt bezeichnet. Das kann ein isolierter Bereich auf einem Wafer, ein einzelnes Bauteil, eine Baugruppe oder ein komplettes Gerät sein. Welche Funktionen des DUT geprüft werden, ist abhängig von seiner Art, den zu ermittelnden Testparametern oder Messwerten und den zur Verfügung stehenden Prüfmitteln und Messgeräten. (de)
rdfs:label Device Under Test (de) Device under test (en) テスト対象デバイス (ja) 被测器件 (zh)
owl:sameAs freebase:Device under test wikidata:Device under test dbpedia-de:Device under test dbpedia-ja:Device under test dbpedia-zh:Device under test https://global.dbpedia.org/id/FqxG
prov:wasDerivedFrom wikipedia-en:Device_under_test?oldid=1119285794&ns=0
foaf:isPrimaryTopicOf wikipedia-en:Device_under_test
is dbo:wikiPageDisambiguates of dbr:DUT
is dbo:wikiPageRedirects of dbr:Device_Under_Test dbr:Equipment_under_test dbr:Unit_under_test dbr:Devices_Under_Test dbr:Unit_Under_Test
is dbo:wikiPageWikiLink of dbr:Bead_probe_technology dbr:Bed_of_nails_tester dbr:Scattering_parameters dbr:Electronic_test_equipment dbr:Electrostatic_discharge dbr:Signal_tracer dbr:Current_injection_technique dbr:DUT_board dbr:ESD_simulator dbr:Insertion_loss dbr:LAN_eXtensions_for_Instrumentation dbr:Conducted_emissions dbr:Mass_interconnect dbr:Network_analyzer_(electrical) dbr:Standard_Test_Data_Format dbr:RF_switch_matrix dbr:Contactor dbr:Calibration dbr:Functional_testing_(manufacturing) dbr:Device_Under_Test dbr:Plot_(graphics) dbr:Test_bench dbr:Test_engineer dbr:Transmission-line_pulse dbr:DUT dbr:Abbreviated_Test_Language_for_All_Systems dbr:Isolation_transformer dbr:Partial_discharge dbr:Equipment_under_test dbr:Random_test_generator dbr:Test_fixture dbr:Test_probe dbr:LCR_meter dbr:Bit_error_rate dbr:SystemVerilog dbr:Highly_accelerated_life_test dbr:Triaxial_cable dbr:Mobile-device_testing dbr:Automatic_test_equipment dbr:Pogo_pin dbr:Human-body_model dbr:Capacitance dbr:Capacitance_meter dbr:Xilinx_ISE dbr:System_under_test dbr:Shmoo_plot dbr:Unit_under_test dbr:IEC_61000-4-2 dbr:Slotted_line dbr:TEM_cell dbr:Semiconductor_curve_tracer dbr:Packet_analyzer dbr:Synthetic_instrument dbr:RF_switch dbr:Devices_Under_Test dbr:Unit_Under_Test
is foaf:primaryTopic of wikipedia-en:Device_under_test