Fabrication of tuning-fork based AFM and STM tungsten probe (original) (raw)
Dynamic electrochemical-etching technique for tungsten tips suitable for multi-tip scanning tunneling microscopes
Shuji Hasegawa
e-Journal of Surface Science and Nanotechnology, 2007
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Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
Peter Grutter
Review of Scientific Instruments, 2011
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Fabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy
Victor Aristov
Scientific reports, 2014
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Two-step controllable electrochemical etching of tungsten scanning probe microscopy tips
Yasser Khan
Review of Scientific Instruments
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Reproducible Electrochemical Etching of Tungsten Probe Tips
Peter Goughnour
Nano Letters, 2002
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Determination of the atomic structure of scanning probe microscopy tungsten tips by field ion microscopy
Peter Grutter
Physical Review B, 2005
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Effect of Fabrication Process Parameters on the Apex-Radius of STM Tungsten Nanotip
Vahid Ahmadi
Scanning, 2009
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Simulation-guided nanofabrication of high-quality practical tungsten probes
Sandra Elizabeth Saji
RSC Advances, 2020
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Etching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy
Venkat Chandrasekhar
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2020
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Experimental Investigation of Reproducible Electrochemical Etching Technique of Tungsten Probe at Domestic level for SPM
Ashfaq Ali
International Journal of Scientific and Research Publications (IJSRP), 2020
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Sharp Needles: Fabrication of Tungsten Nanotips by AC Electrochemical Etching and Laser Enhanced Etching for Nanoprobing on Interconnects of Advanced Technology Nodes
ZHIHONG MAI
MRS Proceedings, 2013
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Development and Comparative Analysis of Electrochemically Etched Tungsten Tips for Quartz Tuning Fork Sensor
Ashfaq Ali
Micromachines, 2021
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Preparation and characterization of electrochemically etched W tips for STM
H. Olin
Measurement Science and Technology, 1999
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An alternative isolation of tungsten tips for a scanning tunneling microscope
Esta Abelev
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Electrochemical preparation of tungsten tips for a scanning tunneling microscope
Eloy Anguiano
Review of Scientific Instruments, 1996
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Field ion microscope evaluation of tungsten nanotip shape using He and Ne imaging gases
Radovan Urban, J. Pitters
Ultramicroscopy, 2012
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Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork
Jerome Polesel, Francois Thoyer, José Morán
Current Applied Physics, 2015
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Tapping and shear-mode atomic force microscopy using a quartz tuning fork with high quality factor
Tran Xuan Hoai
2008
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Fabrication and Study of Micro Monolithic Tungsten Ball Tips for Micro/Nano-CMM Probes
Kuang-Chao Fan
Micromachines, 2018
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Electrically conducting probes with full tungsten cantilever and tip for scanning probe applications
Giovanni Boero
Nanotechnology, 2006
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Super Sharp-Metal Tips for Combined Scanning Tunneling and Force Microscopy Based on Piezoelectric Quartz Tuning Fork Force Sensors
Mahmmoud Sayed Abd El-sadek
2017
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Electrochemical etching of lightweight nanotips for high quality-factor quartz tuning fork force sensor: atomic force microscopy applications
Danish Hussain
Micro & Nano Letters, 2018
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Fabrication of High Performance Probes for Atomic Force Microscope Afm
Medhat Samaan
University of Waterloo, 2021
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Atomic force microscope integrated into a scanning electron microscope for fabrication and metrology at the nanometer scale
Ivo Rangelow
Photomask Technology 2019, 2019
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Ultrasharp tungsten tips—characterization and nondestructive cleaning
P. Sobotík, P. Kocán, I. Ošťádal, Ivan Ost'ádal
Ultramicroscopy, 2012
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Angled long tip to tuning fork probes for atomic force microscopy in various environments
Tomonobu Nakayama
Review of Scientific Instruments, 2011
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AFM tip characterization by Kelvin probe force microscopy
Ulrich Heiz
New Journal of Physics, 2010
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Batch Fabrication of Atomic Force Microscopy Probes with Recessed Integrated Ring Microelectrodes at a Wafer Level
Christine Kranz, Heungjoo Shin
Analytical Chemistry, 2007
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Development of wafer-level batch fabrication for combined atomic force–scanning electrochemical microscopy (AFM–SECM) probes
Christine Kranz
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Introductory Review, Scanning Tunneling Microscopy (STM) & Atomic Force Microscopy (AFM)
Suchit Sharma
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