Optical lever calibration in atomic force microscope with a mechanical lever (original) (raw)

Noninvasive determination of optical lever sensitivity in atomic force microscopy

Martin Polcik

Review of Scientific Instruments, 2006

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Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration

Peter Cumpson

Measurement Science and Technology, 2004

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Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

Julien Vitard, Sinan D Haliyo

Review of Scientific Instruments, 2008

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Characterization and optimization of the detection sensitivity of an atomic force microscope for small cantilevers

Paul Hansma

Journal of Applied Physics, 1998

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Accurate determination of spring constant of atomic force microscope cantilevers and comparison with other methods

Yon-kyu Park

Measurement, 2010

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Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI

Peter Cumpson

Nanotechnology, 2003

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Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Andrius Dzedzickis

Materials

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Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Alexander Balatsky

Beilstein Journal of Nanotechnology, 2014

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Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

Tino Hausotte

tm - Technisches Messen, 2019

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Enhanced accuracy of force application for afm nanomanipulation using nonlinear calibration of the optical lever

Sinan D Haliyo

HAL (Le Centre pour la Communication Scientifique Directe), 2008

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Comparison of calibration methods for atomic-force microscopy cantilevers

Chris Hodges

Nanotechnology, 2003

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High-speed atomic force microscopy using an integrated actuator and optical lever detection

Abdullah Atalar

Review of Scientific Instruments, 1996

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Easy and direct method for calibrating atomic force microscopy lateral force measurements

Martin Guthold

2007

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Enhanced Accuracy of Force Application for AFM Nanomanipulation Using Nonlinear Calibration of Optical Levers

Julien Vitard, Sinan D Haliyo

IEEE Sensors Journal, 2000

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Design and control of atomic force microscopes

Kamal Youcef-toumi

Proceedings of the 2003 American Control Conference, 2003., 2003

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A direct micropipette-based calibration method for atomic force microscope cantilevers

Baoyu Liu

Review of Scientific Instruments, 2009

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Cantilever tilt compensation for variable-load atomic-force microscopy

Matthew Brukman

2005

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Calibrating laser beam deflection systems for use in atomic force microscopes and cantilever sensors

Vincent Tabard-cossa, Peter Grutter

Applied Physics Letters, 2006

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An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments

Naveen Shamsudhin, Semih Sevim, Luying Feng, Sevil Ozer

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Design of an atomic force microscope and first results

Peter Grutter

Surface Science, 1987

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Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

Toshio Ando

The Review of scientific instruments, 2015

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Finite Element Study Of The Metrological Aspects Of Atomic Force Microscope Cantilevers

Savas Mitridis

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Calibration of rectangular atomic force microscope cantilevers

jjisjd fads

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Monitoring of an atomic force microscope cantilever with a compact disk pickup

B. Tiribilli

Review of Scientific Instruments, 1999

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MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY

Joël Chevrier

2005

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Concept and Demonstration of Individual Probe Actuation in Two-Dimensional Parallel Atomic Force Microscope System

Harry Heinzelmann

Japanese Journal of Applied Physics, 2007

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Calibration of atomic force microscope probes using a pneumatic micromanipulation system

Danish Hussain

2017 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), 2017

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Contact imaging in the atomic force microscope using a higher order flexural mode combined with a new sensor

Abdullah Atalar

Applied Physics Letters, 1996

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On dual actuation in atomic force microscopes

Kamal Youcef-toumi

… Control Conference, 2004 …, 2004

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An atomic‐resolution atomic‐force microscope implemented using an optical lever

Paul Hansma

Journal of Applied Physics, 1989

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Interdigital cantilevers for atomic force microscopy

Abdullah Atalar

Applied Physics Letters, 1996

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A Compact Vertical Scanner for Atomic Force Microscopes

동연 이

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A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy

Jon Pratt

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