Nanolithography Study Using Scanning Probe Microscope (original) (raw)

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Introduction Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization

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Scratch Nanolithography on Si Surface Using Scanning Probe Microscopy: Influence of Scanning Parameters on Groove Size

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Atomic force microscopy and direct surface force measurements

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Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy

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Microstructural Characterization of Hierarchical Structured Surfaces by Atomic Force Microscopy

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