Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity (original) (raw)
Determination of Thickness, Refractive Index, and Thickness Irregularity for Semiconductor Thin Films from Transmission Spectra
Asghari Maqsood, Akram Aqili
Applied Optics, 2002
View PDFchevron_right
Structural and Optical Properties of Varies Thickness of ZnTe Nanoparticle Thin Films
عصام رمضان شعبان شعبان
View PDFchevron_right
Author's Accepted Manuscript Determination of the optical Constants and film thickness of ZnTe and ZnS thin films in terms of spectrophotometric and spectroscopic ellipsometry
abdelaziz aboraia
View PDFchevron_right
Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements
Noha CHAHBOUN
Thin Solid Films, 2000
View PDFchevron_right
Determination of the thickness and optical constants of thin films from transmission spectra
Miklós Kubinyi
Thin Solid Films, 1996
View PDFchevron_right
Structural and Optical Properties of Varies Thickness of Znte Nanoparticle
Ahmed Zidan, Asco. Prof. Mohamed A . Youssef, Enver Zenku, abdelaziz aboraia, essam Ahmed Ali Abdel Wahab
View PDFchevron_right
Optical Properties of Thin Semiconductor Films
영진 송
View PDFchevron_right
Reflectivity of GaAs Thin Films
Gerard Czajkowski
physica status solidi (b), 1993
View PDFchevron_right
Analysis of Reflectance and Transmittance Characteristics of Optical Thin Film for Various Film Materials, Thicknesses and Substrates
NASRIN SULTANA
Journal of Electrical & Electronic Systems, 2015
View PDFchevron_right
Determination of Optical Constants of Thin Films and Multilayer Stacks by Use of Concurrent Reflectance, Transmittance, and Ellipsometric Measurements
Rongguang Liang
Applied Optics, 2001
View PDFchevron_right
Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data
Sergio Ventura
Journal of Applied Physics, 2005
View PDFchevron_right
Determination of optical parameters and thickness of weakly absorbing thin films from reflectance and transmittance spectra
Valery Filippov
Applied Optics, 2006
View PDFchevron_right
A method to extract absorption coefficient of thin films from transmission spectra of the films on thick substrates
Sean King
Journal of Applied Physics, 2012
View PDFchevron_right
Thin film thickness determination using X-ray reflectivity and Savitzky–Golay algorithm
J. Serafińczuk
View PDFchevron_right
Effects of thin film thickness on emittance, reflectance and transmittance of nano scale multilayers
Ahmad Sedaghat
View PDFchevron_right
PRISA: a user-friendly software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films
Raj Tokas
Nano Express, 2021
View PDFchevron_right
Determination of the Optical Properties of ZnSe Thin Films Using the Transfer Matrix Method
Jhon Vargas
Journal of Physics: Conference Series, 2014
View PDFchevron_right
Dependence of reflectance on angular deposition and film thickness of ZnS/Ag nanolayers
Daniel Mukiibi
Engineering and Applied Science Letters
View PDFchevron_right
Optical Characterization of Dielectric and Semiconductor Thin Films by Use of Transmission Data
Jorge Cisneros
Applied Optics, 1998
View PDFchevron_right
Thickness dependence of the reflection coefficient from thin semiconductor films and measurements of the conductivity
Frank Barnes
Solar Cells, 1982
View PDFchevron_right
Thickness effect on scaling law and surface properties of nano-dimensional SnTe thin films
Dr Dhirendra Chaudhary
Journal of Applied Physics, 2021
View PDFchevron_right
Characterization of thin films based on reflectance and transmittance measurements at oblique angles of incidence
Farshid Manoocheri
Applied Optics, 2006
View PDFchevron_right
Transmission and Reflection Ellipsometry of Thin Films and Multilayer Systems
Võ Nhật Trường
Applied Optics, 1998
View PDFchevron_right
Optical constants of zinc sulfide films determined from transmittance measurements
E. Khawaja
Thin Solid Films, 2000
View PDFchevron_right
Optical Effects in IR Spectroscopy: Thickness-Dependent Positions of Absorbance Lines in Spectra of Thin Films
Marta Gunde
Applied Spectroscopy, 1992
View PDFchevron_right
Reflection and absorption of light by a thin semiconductor film
Valeri Lozovski
Optics and Spectroscopy, 2004
View PDFchevron_right
Optical constants and thickness determination of very thin amorphous semiconductor films
Shuvendu Jena
Journal of Applied Physics, 2002
View PDFchevron_right
XPS intensity analysis for assessment of thickness and composition of thin overlayer films: Application to chemically etched GaAs(100) surfaces
Jostein Grepstad
Surface and Interface Analysis, 1989
View PDFchevron_right
Method to determine the absorptance of thin films for photovoltaic technology
Nathan Tomlin
2010 35th IEEE Photovoltaic Specialists Conference, 2010
View PDFchevron_right
Characterization of thin films by optical techniques
Bouazza Tbib
Characterization of thin films by optical techniques, 2017
View PDFchevron_right
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
Emilio Marquez
Materials, 2021
View PDFchevron_right
Closed equation for the normal incidence reflectance of thin films on absorbing substrates
Diego Montenegro Castro
Applied Optics, 2007
View PDFchevron_right
Characterization of ZnSe Nanolayers by Spectroscopic Ellipsometry
Diana Nesheva
View PDFchevron_right
Determination Of Optical Constants Of Semiconductor Thin Films By Ellipsometry
Aissa Manallah
2016
View PDFchevron_right