Tip-based nano-manufacturing and -metrology (original) (raw)

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Arrayed Tip based Pattern Lithography with Built-in Capacitive Proximal Leveling Sensor

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Current limitations of SEM and AFM metrology for the characterization of 3D nanostructures

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Nanolithography on the Electron Beam Resist using the Scanning Probe Microscope Cantilever

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Field-emission scanning probe lithography with self-actuating and self-sensing cantilevers for single digit nanodevices

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Mechanical scanning probe nanolithography: modeling and application

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Fabrication of arrays of nanometer size test structures for scanning probe microscope tips characterization*

Alexei Bogdanov

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Design and Simulation Analysis of an Electrostatic Actuator for Improving the Performance of Scanning Probe Nanolithography

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Atomic force microscopy lithography as a nanodevice development technique

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