Correction: Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging (original) (raw)
Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging
Gan Chong Leong
PLoS ONE, 2013
View PDFchevron_right
Reliability Assessment and Activation Energy Study of Au and Pd-Coated Cu Wires Post High Temperature Aging in Nanoscale Semiconductor Packaging
Gan Chong Leong
Journal of Electronic Packaging, 2013
View PDFchevron_right
Wearout Reliability and Intermetallic Compound Diffusion Kinetics of Au and PdCu Wires Used in Nanoscale Device Packaging
Uda Hashim
2013
View PDFchevron_right
Extended reliability of gold and copper ball bonds in microelectronic packaging
Uda Hashim
Gold Bulletin, 2013
View PDFchevron_right
Future and technical considerations of gold wirebonding in semiconductor packaging - A technical review
Uda Hashim
2014
View PDFchevron_right
Technical Barriers and Development of Cu Wirebonding in Nanoelectronics Device Packaging
Gan Chong Leong
Journal of Nanomaterials, 2012
View PDFchevron_right
Corrosion Study and Intermetallics Formation in Gold and Copper Wire Bonding in Microelectronics Packaging
Christopher Breach
Crystals, 2013
View PDFchevron_right
Evolution of Bonding Wires used in Semiconductor Packaging: Perspective over 25 years
Gan Chong Leong
View PDFchevron_right
Reliability challenges of Cu wire deployment in flash memory packaging
Uda Hashim
Proceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT, 2012
View PDFchevron_right
Evolutions of bonding wires used in semiconductor electronics: perspective over 25 years
Gan Chong Leong
2014
View PDFchevron_right
Effects of Wire Type and Mold Compound on Wearout Reliability of Semiconductor Flash Fineline BGA Package
Gan Chong Leong
View PDFchevron_right
Effects of Bonding Wires and Epoxy Molding Compound on Gold and Copper Ball Bonds Intermetallic Growth Kinetics in Electronic Packaging
Uda Hashim, Gan Chong Leong
Journal of Electronic Materials
View PDFchevron_right
Thermal Aging Behavior of Fine Pitch Palladium Coated Silver (PCS) Ball Bonds on Al Metallization
Jimy Gomes
International Symposium on Microelectronics, 2015
View PDFchevron_right
Microstructure and reliability of copper interconnects
Alvin Loke
IEEE Transactions on Electron Devices, 1999
View PDFchevron_right
Microelectronic Wire Bonding with Insulated Au Wire: Effects of Process Parameters on Insulation Removal and Crescent Bonding
John Persic
Materials Transactions, 2008
View PDFchevron_right
Corrosion study at Cu–Al interface in microelectronics packaging
Mohd. Ambar Yarmo
Applied Surface Science, 2002
View PDFchevron_right
Microstructural Indicators for Prognostication of Copper–Aluminum Wire Bond Reliability Under High-Temperature Storage and Temperature Humidity
Luu Nguyen
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2016
View PDFchevron_right
On Wire Failures in Microelectronic Packages
Marcel van Gils
IEEE Transactions on Device and Materials Reliability, 2000
View PDFchevron_right
Effects of Cu and Pd addition on Au bonding wire/Al pad interfacial reactions and bond reliability
Kyung-Wook Paik
Journal of Electronic Materials, 2006
View PDFchevron_right
High-temperature degradation of wire bonds in plastic encapsulated microcircuits
Ashok Sharma
View PDFchevron_right
Dynamic damage analysis of thin film stacked structures for microelectronic devices
Facheng Zhao
2023
View PDFchevron_right
Prognostication of Copper Aluminum Wirebond Reliability Under High Temperature Storage and Temperature Humidity
Pradeep Lall
View PDFchevron_right
High temperature reliability of aluminium wire-bonds to thin film, thick film and low temperature co-fired ceramic (LTCC) substrate metallization
Frode Strisland
Microelectronics Reliability, 2008
View PDFchevron_right
Cu Heavy Wirebonding for High Power Device Interconnection
Younghun Byun
IMAPS symposia and conferences, 2013
View PDFchevron_right
Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment
Patrick McCluskey
Microelectronics Reliability, 2018
View PDFchevron_right
The effect of Pd and Cu in the intermetallic growth of alloy Au wire
Albert Yang
Journal of Electronic Materials, 2003
View PDFchevron_right
Thermosonic bonding of gold wire onto silver bonding layer on the bond pads of chips with copper interconnects
Jong-Ning Aoh
Journal of Electronic Materials, 2006
View PDFchevron_right
Failure Mode and Mechanism Analysis for Cu Wire Bond on Cu/Low-k Chip by Wire Pull Test and Finite-Element Analysis
tai chong chai
IEEE Transactions on Device and Materials Reliability, 2018
View PDFchevron_right
Mechanistic study of copper wire-bonding failures on packaging devices in acidic chloride environments
Nick Ross
Microelectronics Reliability, 2020
View PDFchevron_right
The Challenges of Fine Pitch Wire Bonding in Semiconductor Packaging
Nowshad Amin
eng.ukm.my
View PDFchevron_right
Bond strength evaluation of heat treated Cu-Al wire bonding
Joseph Anand
Journal of Mechanical Engineering and Sciences, 2018
View PDFchevron_right