Correction: Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging (original) (raw)

Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging

Gan Chong Leong

PLoS ONE, 2013

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Reliability Assessment and Activation Energy Study of Au and Pd-Coated Cu Wires Post High Temperature Aging in Nanoscale Semiconductor Packaging

Gan Chong Leong

Journal of Electronic Packaging, 2013

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Wearout Reliability and Intermetallic Compound Diffusion Kinetics of Au and PdCu Wires Used in Nanoscale Device Packaging

Uda Hashim

2013

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Extended reliability of gold and copper ball bonds in microelectronic packaging

Uda Hashim

Gold Bulletin, 2013

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Future and technical considerations of gold wirebonding in semiconductor packaging - A technical review

Uda Hashim

2014

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Technical Barriers and Development of Cu Wirebonding in Nanoelectronics Device Packaging

Gan Chong Leong

Journal of Nanomaterials, 2012

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Corrosion Study and Intermetallics Formation in Gold and Copper Wire Bonding in Microelectronics Packaging

Christopher Breach

Crystals, 2013

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Evolution of Bonding Wires used in Semiconductor Packaging: Perspective over 25 years

Gan Chong Leong

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Reliability challenges of Cu wire deployment in flash memory packaging

Uda Hashim

Proceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT, 2012

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Evolutions of bonding wires used in semiconductor electronics: perspective over 25 years

Gan Chong Leong

2014

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Effects of Wire Type and Mold Compound on Wearout Reliability of Semiconductor Flash Fineline BGA Package

Gan Chong Leong

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Effects of Bonding Wires and Epoxy Molding Compound on Gold and Copper Ball Bonds Intermetallic Growth Kinetics in Electronic Packaging

Uda Hashim, Gan Chong Leong

Journal of Electronic Materials

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Thermal Aging Behavior of Fine Pitch Palladium Coated Silver (PCS) Ball Bonds on Al Metallization

Jimy Gomes

International Symposium on Microelectronics, 2015

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Microstructure and reliability of copper interconnects

Alvin Loke

IEEE Transactions on Electron Devices, 1999

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Microelectronic Wire Bonding with Insulated Au Wire: Effects of Process Parameters on Insulation Removal and Crescent Bonding

John Persic

Materials Transactions, 2008

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Corrosion study at Cu–Al interface in microelectronics packaging

Mohd. Ambar Yarmo

Applied Surface Science, 2002

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Microstructural Indicators for Prognostication of Copper–Aluminum Wire Bond Reliability Under High-Temperature Storage and Temperature Humidity

Luu Nguyen

IEEE Transactions on Components, Packaging and Manufacturing Technology, 2016

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On Wire Failures in Microelectronic Packages

Marcel van Gils

IEEE Transactions on Device and Materials Reliability, 2000

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Effects of Cu and Pd addition on Au bonding wire/Al pad interfacial reactions and bond reliability

Kyung-Wook Paik

Journal of Electronic Materials, 2006

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High-temperature degradation of wire bonds in plastic encapsulated microcircuits

Ashok Sharma

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Dynamic damage analysis of thin film stacked structures for microelectronic devices

Facheng Zhao

2023

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Prognostication of Copper Aluminum Wirebond Reliability Under High Temperature Storage and Temperature Humidity

Pradeep Lall

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High temperature reliability of aluminium wire-bonds to thin film, thick film and low temperature co-fired ceramic (LTCC) substrate metallization

Frode Strisland

Microelectronics Reliability, 2008

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Cu Heavy Wirebonding for High Power Device Interconnection

Younghun Byun

IMAPS symposia and conferences, 2013

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Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment

Patrick McCluskey

Microelectronics Reliability, 2018

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The effect of Pd and Cu in the intermetallic growth of alloy Au wire

Albert Yang

Journal of Electronic Materials, 2003

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Thermosonic bonding of gold wire onto silver bonding layer on the bond pads of chips with copper interconnects

Jong-Ning Aoh

Journal of Electronic Materials, 2006

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Failure Mode and Mechanism Analysis for Cu Wire Bond on Cu/Low-k Chip by Wire Pull Test and Finite-Element Analysis

tai chong chai

IEEE Transactions on Device and Materials Reliability, 2018

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Mechanistic study of copper wire-bonding failures on packaging devices in acidic chloride environments

Nick Ross

Microelectronics Reliability, 2020

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The Challenges of Fine Pitch Wire Bonding in Semiconductor Packaging

Nowshad Amin

eng.ukm.my

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Bond strength evaluation of heat treated Cu-Al wire bonding

Joseph Anand

Journal of Mechanical Engineering and Sciences, 2018

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