Atomic scale models of ion implantation and dopant diffusion in silicon (original) (raw)

First-principles-based predictive simulations of B diffusion and activation in ion implanted Si

M. Foad

2000

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Atomistic calculations of ion implantation in Si: Point defect and transient enhanced diffusion phenomena

George Gilmer

Applied Physics Letters, 1996

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Atomistic modeling of ion implantation technologies in silicon

Lourdes Pelaz

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2015

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Atomistic modeling of the effects of dose and implant temperature on dopant diffusion and amorphization in Si

George Gilmer, Lourdes Pelaz

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2001

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Physical mechanisms of transient enhanced dopant diffusion in ion-implanted silicon

George Gilmer

Journal of Applied Physics, 1997

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Atomistic analysis of defect evolution and transient enhanced diffusion in silicon

Lourdes Pelaz

Journal of Applied Physics, 2003

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Atomistic modeling of dopant implantation, diffusion, and activation

Lourdes Pelaz

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2006

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The effect of ramp rate and annealing temperature on boron transient diffusion in implanted silicon: kinetic Monte Carlo simulations

M. Foad

1998 International Conference on Ion Implantation Technology. Proceedings (Cat. No.98EX144), 1998

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Accurate and Computationally Efficient Modeling of Ion Implantation in Single-Crystal Silicon

Harshit Agarwal

COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, 1992

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A universal ion implantation model for all species into single-crystal silicon

Gaurav Shrivastav

IEEE Transactions on Electron Devices, 2002

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Modeling of defects, dopant diffusion and clustering in silicon

Lourdes Pelaz

Journal of Computational Electronics, 2014

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Monte Carlo modeling of amorphization resulting from ion implantation in Si

Lourdes Pelaz

Computational Materials Science, 2003

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Modeling of the transient interstitial diffusion of implanted atoms during low-temperature annealing of silicon substrates

Oleg Velichko

Physica B: Condensed Matter, 2012

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Defect engineering via ion implantation to control B diffusion in Si

Marica Canino

Materials Science and Engineering: B, 2009

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Ion implant simulations: Kinetic Monte Carlo annealing assessment of the dominant features

Pedro Castrillo, Ignacio Martin-Bragado

Applied Physics Letters, 2004

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Atomic scale modeling of boron transient diffusion in silicon

majeed foad

1998 International Conference on Ion Implantation Technology. Proceedings (Cat. No.98EX144), 1998

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Diffusion and deactivation of As in Si: Combining atomistic and continuum simulation approaches

W. Lerch

2007

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B diffusion and clustering in ion implanted Si: The role of B cluster precursors

Lourdes Pelaz

Applied Physics Letters, 1997

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Nucleation, growth and dissolution of extended defects in implanted Si: impact on dopant diffusion

D. Mathiot

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1999

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CONTRIBUTIONS TO THE MODELLING AND SIMULATION OF THE ATOMIC TRANSPORT PROCESSES IN SILICON AND POLYSILICON AND APPLICATIONS*

Dr. Florin Gaiseanu

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Physical atomistic kinetic Monte Carlo modeling of Fermi-level effects of species diffusing in silicon

M. Jaraiz

Physical Review B, 2005

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Defects evolution and dopant activation anomalies in ion implanted silicon

Y. Lamrani, F. Cristiano

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2006

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Simulation of Arsenic Diffusion During Rapid Thermal Annealing of Silicon Layers Doped with Low-Energy High-Dose Ion Implantation

Oleg Velichko

2005

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Atomistic modeling of ion beam induced amorphization in silicon

Pedro Lopez

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2004

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Atomistic simulations in Si processing: Bridging the gap between atoms and experiments

Lourdes Pelaz, MarĂ­a Aboy

Materials Science and Engineering: B, 2005

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Comparison of boron halide, decaborane and B implants in Si from Molecular Dynamics simulations

Christopher Jeynes

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2003

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