Effect of Trap Density on Carrier Propagation in Organic Field-Effect Transistors Investigated by Impedance Spectroscopy (original) (raw)
2010, Japanese Journal of Applied Physics
Related papers
IETI Transactions on Engineering Research and Practice, 2018
In this paper, new-improved carriers mobility model of OFET (Organic Field Effect Transistor) structures is presented. It is proposed to introduce two new factors: traps concentration ratio and electric field degradation factor, in carriers mobility model. The imact of OFET geometry is also considered. The above-mentioned model includes also carriers mobility dependence on temperature and electric field. Proposed model is incorporated in current-voltage characteristics of OFET.
Loading Preview
Sorry, preview is currently unavailable. You can download the paper by clicking the button above.