Superhard, conductive coatings for atomic force microscopy cantilevers (original) (raw)

Fabrication of High Performance Probes for Atomic Force Microscope Afm

Medhat Samaan

University of Waterloo, 2021

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Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping

Pierre Eyben

Smart Sensors, Actuators, and MEMS, 2003

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Influence of Thin Film Deposition on AFM Cantilever Tips in Adhesion and Young’s Modulus of MEMS Surfaces

Simona Caprarescu

Materials, 2022

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Porous thin films for the characterization of atomic force microscope tip morphology

Doug Vick

Thin Solid Films, 2002

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Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology

Yingfan Xiong

Photonics

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Evaluation of Intermittent Contact Mode AFM Probes by HREM and Using Atomically Sharp CeO 2 Ridges as Tip Characterizer

Björn Skårman

Langmuir, 2000

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Advanced atomic force microscopy probes: Wear resistant designs

Thai Bao

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2005

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Practical Method to Limit Tip–Sample Contact Stress and Prevent Wear in Amplitude Modulation Atomic Force Microscopy

Vahid Vahdat

ACS Nano, 2013

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Nanoscale Measurement of Surface Roughness and the existing Surface Forces of Aluminum by AFM

shobha lamichhane

Himalayan Physics, 2011

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Ion-beam-sputter deposited titanium nitride thin films for conductive atomic force microscope probes

Bernard Liu

Thin Solid Films, 2013

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DRIE based novel technique for AFM probes fabrication

Guillermo Villanueva

Microelectronic Engineering, 2007

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Improved atomic force microscopy cantilever performance by partial reflective coating

Yoichi Miyahara

Beilstein Journal of Nanotechnology, 2015

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Simultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes

Michael Stadermann

Review of Scientific Instruments, 2003

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Characterization of atomic force microscope probes at low temperatures

Francesco Valle

Journal of Applied Physics, 2003

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Atomic force microscopy and direct surface force measurements (IUPAC Technical Report

Ian Larson

Pure and Applied Chemistry, 2005

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AFM tip characterization by Kelvin probe force microscopy

Ulrich Heiz

New Journal of Physics, 2010

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Atomic Force Microscopy AFM

Nasrin Azad-McGuire

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Mechanics of Interaction and Atomic-Scale Wear of Amplitude Modulation Atomic Force Microscopy Probes

Vahid Vahdat

ACS Nano, 2013

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Surface chemistry and tip-sample interactions in atomic force microscopy

Tim Senden

Colloids and Surfaces A-physicochemical and Engineering Aspects, 1995

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Atomic force microscopy and direct surface force measurements

Ian Larson

Pure and Applied Chemistry, 2005

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Adhesion measurement of micropatterned surfaces using three-dimensional-printed atomic force microscopy tips

YP Yeh

Japanese Journal of Applied Physics, 2017

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Mechanics of interactions and atomic-scale wear of tips in amplitude modulation atomic force microscopy

Vahid Vahdat

2013

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Sharp High-Aspect-Ratio AFM Tips Fabricated by a Combination of Deep Reactive Ion Etching and Focused Ion Beam Techniques

David Caballero

Journal of Nanoscience and Nanotechnology, 2010

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Express analysis of actual bluntness of AFM probe tips

Zaynab Naif Alraziqi

2017

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Introductory Review, Scanning Tunneling Microscopy (STM) & Atomic Force Microscopy (AFM)

Suchit Sharma

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Integrating micro- and nanoelectrodes into atomic force microscopy cantilevers using focused ion beam techniques

Alois Lugstein

Applied Physics Letters, 2002

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Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering

Dietmar Hirsch

Applied Surface Science, 2001

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Wear comparison of critical dimension-atomic force microscopy tips

Ernesto Lopez

Journal of Micro/Nanolithography, MEMS, and MOEMS, 2020

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Tip–surface interactions in atomic force microscopy: reactive vs. metallic surfaces

Ivan Štich

Applied Surface Science, 2002

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Enhanced Functionality of Carbon Nanotube Modified Atomic Force Probes and Applications

Sachin Shah

2004

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Atomic force microscope integrated into a scanning electron microscope for fabrication and metrology at the nanometer scale

Ivo Rangelow

Photomask Technology 2019, 2019

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Atomic force microscopy on cross-sections of optical coatings: a new method

Kaj Pischow

Thin Solid Films, 1995

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Fabrication of ball-shaped atomic force microscope tips by ion-beam-induced deposition of platinum on multiwall carbon nanotubes

Jae-joon Lee

Ultramicroscopy, 2009

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High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy

Yoichi Miyahara

Review of Scientific Instruments, 2007

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