Inductively coupled plasma etching of tapered via in silicon for MEMS integration (original) (raw)

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SURFACE ROUGHNESS GENERATED BETWEENSI FRESNEL RINGS IN í µí°‚í µí°‡í µí° í µí¿‘ /í µí°Ž í µí¿ PLASMA ETCHING USINGINDUCTIVE COUPLE PLASMA ETCHING ICP-RIE SYSTEM

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