Transmission electron microscopy (original) (raw)
Un microscopi electrònic de transmissió (TEM, per les seves sigles en anglès de Transmission Electron Microscope, o MET, en català) és un microscopi que utilitza un feix d'electrons per visualitzar un objecte. La potència amplificadora d'un microscopi òptic està limitada per la longitud d'ona de la llum visible. A causa que els electrons tenen una longitud d'ona molt menor que la de la llum visible, poden mostrar estructures molt més petites. Entre altres coses, s'utilitza en microbiologia, ja que permet observar l'estructura dels virus, i en nanoenginyeria.
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| dbo:abstract | المجهر الإلكتروني النافذ (Transmission electron microscopy) والذي يرمز له اختصاراً TEM يعد المجهر الإلكتروني النافذ أداة قوية جدًا لعلوم المواد. تضيء حزمة عالية الطاقة من الإلكترونات عبر عينة رقيقة جدًا، ويمكن استخدام التفاعلات بين الإلكترونات والذرات لمراقبة ميزات مثل البنية البلورية والميزات في بنية مثل الخلع وحدود الحبوب. يمكن أيضا إجراء التحليل الكيميائي. يمكن استخدام TEM لدراسة نمو الطبقات وتكوينها وعيوبها في أشباه الموصلات. يمكن استخدام دقة عالية لتحليل نوعية وشكل وحجم وكثافة الآبار الكمومية والأسلاك والنقاط. يعمل TEM على نفس المبادئ الأساسية مثل المجهر الضوئي، لكنه يستخدم الإلكترونات بدلاً من الضوء. نظرًا لأن طول موجة الإلكترونات أصغر بكثير من طول الضوء، فإن الدقة المثلى التي يمكن الحصول عليها لصور TEM هي عدد كبير من الأحجام على نحو أفضل من مجهر الضوء. وبالتالي، يمكن أن تكشف TEMs عن أدق تفاصيل البنية الداخلية - في بعض الحالات صغيرة مثل الذرات الفردية. (ar) Un microscopi electrònic de transmissió (TEM, per les seves sigles en anglès de Transmission Electron Microscope, o MET, en català) és un microscopi que utilitza un feix d'electrons per visualitzar un objecte. La potència amplificadora d'un microscopi òptic està limitada per la longitud d'ona de la llum visible. A causa que els electrons tenen una longitud d'ona molt menor que la de la llum visible, poden mostrar estructures molt més petites. Entre altres coses, s'utilitza en microbiologia, ja que permet observar l'estructura dels virus, i en nanoenginyeria. (ca) Transmisní elektronový mikroskop (TEM) je elektronový mikroskop umožňující zobrazení a měření strukturních, chemických a mechanických vlastností látek až na atomární úrovni. Na rozdíl od světelného mikroskopu nevyužívá k pozorování viditelného světla ale urychlených elektronů. Na rozdíl od skenovacího elektronového mikroskopu (SEM), který primárně mapuje povrchu vzorku, TEM vzorek prosvěcí a přináší tak informaci z jeho objemu. Oproti maximálnímu efektivnímu zvětšení světelného mikroskopu (řádově 1000×) poskytuje TEM zvětšení výrazně vyšší (řádově 1 000 000×). Taková úroveň detailu umožňuje např. u krystalických materiálů zobrazení krystalové struktury a jejích poruch. Spolu s a případnými doplňkovými analytickými metodami umožňuje TEM ve vzorku změřit např. rozložení výskytu chemických prvků, parametrů krystalové mřížky, mechanického napětí nebo orientace krystalických zrn. Tím přispívá k pochopení vlastností a jevů určujících makroskopické chování materiálů. Své využití nachází TEM i při studiu biologických materiálů. Česká republika patří ke světové špičce jak ve výrobě elektronových mikroskopů, tak v oblasti související vědy a výzkumu. (cs) Die Transmissionselektronenmikroskopie (TEM, steht auch für Transmissionselektronenmikroskop) ist eine Betriebsart für Elektronenmikroskope, die eine direkte Abbildung von Objekten mithilfe von Elektronenstrahlen ermöglicht. In den 1930er-Jahren wurde erstmals das Auflösungsvermögen von optischen Mikroskopen durch die bahnbrechenden Arbeiten von Max Knoll und seinem damaligen Doktoranden Ernst Ruska überschritten. Letzterer wurde 1986 mit dem Nobelpreis für Physik ausgezeichnet. Die derzeitige Auflösungsgrenze liegt bei 0,045 nm. (de) Un microscopio electrónico de transmisión (TEM por su sigla en inglés, o MET en español) es un microscopio que utiliza un haz de electrones para visualizar un objeto, debido a que la potencia amplificadora de un microscopio óptico está limitada por la longitud de onda de la luz visible. Lo característico de este microscopio es el uso de una muestra ultrafina y que la imagen se obtenga de los electrones que atraviesan la muestra. Los microscopios electrónicos de transmisión pueden disminuir un objeto hasta un millón de veces. (es) La microscopie électronique en transmission (MET, ou TEM pour Transmission Electron Microscopy) est une technique de microscopie où un faisceau d'électrons est « transmis » à travers un échantillon très mince. Les effets d'interaction entre les électrons et l'échantillon donnent naissance à une image, dont la résolution peut atteindre 0,08 nanomètre (voire 0,04 nm). Les images obtenues ne sont généralement pas explicites, et doivent être interprétées à l'aide d'un support théorique. L'intérêt principal de ce microscope est de pouvoir combiner cette grande résolution avec les informations de l'espace de Fourier, c'est-à-dire la diffraction. Il est aussi possible d'identifier la composition chimique de l'échantillon en étudiant le rayonnement X provoqué par le faisceau électronique. Contrairement aux microscopes optiques, la résolution n'est pas limitée par la longueur d'onde des électrons, mais par les aberrations dues aux lentilles magnétiques. Le principe du microscope électronique en transmission a été mis au point en 1931 par Max Knoll et Ernst Ruska. Ce dernier a d'ailleurs reçu le prix Nobel de physique en 1986 pour cette invention. Elle consiste à placer un échantillon suffisamment mince sous un faisceau d'électrons, et à utiliser un système de lentilles magnétiques pour projeter l'image électronique de l'échantillon sur un écran phosphorescent qui la transforme en image optique. Pour les échantillons cristallins, un autre mode d'utilisation consiste à visualiser le cliché de diffraction de l'échantillon. Les applications de la microscopie électronique couvrent un très vaste domaine, de l'observation d'échantillons biologiques, comme le noyau des cellules à l'analyse d'échantillons industriels dans la métallurgie ou l'industrie des semi-conducteurs. (fr) Mikroskop transmisi elektron (bahasa Inggris: Transmission electron microscopy, disingkat TEM) adalah teknik mikroskop di mana berkas elektron ditransmisikan melalui spesimen untuk membentuk gambar. Spesimen paling sering merupakan bagian yang sangat tipis dengan tebal kurang dari 100 nm atau suspensi pada bingkai. Sebuah gambar terbentuk dari interaksi elektron dengan sampel saat berkas ditransmisikan melalui benda uji. Gambar kemudian diperbesar dan difokuskan ke perangkat pencitraan, seperti layar fluoresen, lapisan film gulung, atau sensor seperti kilau yang dipasang ke peranti tergandeng-muatan. TEM pertama didemonstrasikan oleh dan Ernst Ruska pada tahun 1931, dengan kelompok ini mengembangkan TEM pertama dengan resolusi lebih besar dari resolusi cahaya pada tahun 1933 dan TEM komersial pertama pada tahun 1939. Pada tahun 1986, Ruska dianugerahi Penghargaan Nobel bidang Fisika untuk pengembangan mikroskop transmisi elektron. (in) Il microscopio elettronico a trasmissione, di solito indicato con l'acronimo TEM, dall'inglese transmission electron microscope, è un tipo di microscopio elettronico. (it) Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device. Transmission electron microscopes are capable of imaging at a significantly higher resolution than light microscopes, owing to the smaller de Broglie wavelength of electrons. This enables the instrument to capture fine detail—even as small as a single column of atoms, which is thousands of times smaller than a resolvable object seen in a light microscope. Transmission electron microscopy is a major analytical method in the physical, chemical and biological sciences. TEMs find application in cancer research, virology, and materials science as well as pollution, nanotechnology and semiconductor research, but also in other fields such as paleontology and palynology. TEM instruments have multiple operating modes including conventional imaging, scanning TEM imaging (STEM), diffraction, spectroscopy, and combinations of these. Even within conventional imaging, there are many fundamentally different ways that contrast is produced, called "image contrast mechanisms". Contrast can arise from position-to-position differences in the thickness or density ("mass-thickness contrast"), atomic number ("Z contrast", referring to the common abbreviation Z for atomic number), crystal structure or orientation ("crystallographic contrast" or "diffraction contrast"), the slight quantum-mechanical phase shifts that individual atoms produce in electrons that pass through them ("phase contrast"), the energy lost by electrons on passing through the sample ("spectrum imaging") and more. Each mechanism tells the user a different kind of information, depending not only on the contrast mechanism but on how the microscope is used—the settings of lenses, apertures, and detectors. What this means is that a TEM is capable of returning an extraordinary variety of nanometer- and atomic-resolution information, in ideal cases revealing not only where all the atoms are but what kinds of atoms they are and how they are bonded to each other. For this reason TEM is regarded as an essential tool for nanoscience in both biological and materials fields. The first TEM was demonstrated by Max Knoll and Ernst Ruska in 1931, with this group developing the first TEM with resolution greater than that of light in 1933 and the first commercial TEM in 1939. In 1986, Ruska was awarded the Nobel Prize in physics for the development of transmission electron microscopy. (en) 透過型電子顕微鏡（とうかがたでんしけんびきょう、Transmission Electron Microscope; TEM）とは、電子顕微鏡の一種である。観察対象に電子線をあて、透過してきた電子線の強弱から観察対象内の電子透過率の空間分布を観察するタイプの電子顕微鏡のこと。また、電子の波動性を利用し、試料内での電子の回折 (電子回折) の結果生じる干渉像から観察対象物の構造を観察する場合もある。物理学、化学、工学、生物学、医学などで幅広く用いられている。 (ja) Transmisyjny mikroskop elektronowy (TEM, z ang. transmission electron microscope) – rejestrowane są elektrony przechodzące przez próbkę. Próbką w takim mikroskopie musi być cienka płytka o grubości rzędu setek nanometrów. Przygotowanie takiej próbki jest trudne i znacznie ogranicza zastosowania mikroskopu. (pl) Um microscópio eletrônico de transmissão (português brasileiro) ou microscópio eletrónico de transmissão (português europeu) (MET) é um microscópio no qual um feixe de elétrons é emitido em direção a uma amostra ultra fina, interagindo com a amostra enquanto a atravessa. A interação dos elétrons transmitidos através da amostra forma uma imagem que é ampliada e focada em um dispositivo de imagem, como uma tela fluorescente em uma camada de filme fotográfico, ou detectada por um sensor como uma câmera CCD. Um MET é capaz de exibir imagens a uma resolução significativamente maior em comparação com os microscópios óticos devido ao pequeno comprimento de onda dos elétrons. Tal característica permite ao usuário examinar detalhes ínfimos, até mesmo uma simples coluna de átomos, a qual é dezenas de milhares vezes menor do que o menor objeto reconhecível em um microscópio ótico. O MET é um dos principais métodos de análise em uma vasta gama de campos científicos, tanto em ciências físicas quanto biológicas. O MET é aplicado na pesquisa do câncer, virologia e na ciência dos materiais, além das pesquisas de poluição, nanotecnologia e semicondutores. A pequenas ampliações, o (contraste) na imagem deve-se à absorção de elétrons pelo material, como consequência da sua espessura e composição. A ampliações maiores, a intensidade da imagem é resultante de um conjunto complexo de interações de ondas, o que requer a análise das imagens obtidas por parte de peritos. A alternância entre estas formas de uso permite observar através do MET modulações na composição química, orientação de cristais, estrutura eletrônica e a indução da mudança da fase eletrônica bem como as comuns imagens baseadas na absorção do material. O primeiro MET foi construído por Max Knoll e Ernst Ruska em 1931, parte do grupo que desenvolveria o primeiro MET com poder de resolução superior ao da luz em 1933 e o primeiro TEM comercial em 1939. (pt) Просве́чивающий (трансмиссио́нный) электро́нный микроско́п (ПЭМ, англ, TEM — Transmission electron microscopy) — устройство для получения изображения с помощью проходящего через образец пучка электронов. Отличается от других типов электронных микроскопов тем, что электронный пучок просвечивает образец, неоднородное поглощение электронов разными участками образца дает двумерную картину распределения плотности прошедшего электронного потока. Прошедший через образец поток затем фокусируется на регистрирующей поверхности магнитными электронными линзами (электронной оптикой) в увеличенном размере. В качестве регистрирующей поверхности применяют флуоресцентные экраны, покрытые слоем люминофора, фотоплёнку или фотопластинку, или приборы с зарядовой связью (на ПЗС-матрице). Например, на слое люминофора образуется светящееся видимое изображение. Так как поток электронов сильно поглощается веществом, изучаемые образцы должны иметь очень маленькую толщину, так называемые ультратонкие образцы. Ультратонким считается образец толщиной менее 0,1 мкм. (ru) 透射电子显微镜（英語：Transmission electron microscope，縮寫：TEM、CTEM），简称透射电镜，是把经加速和聚集的电子束投射到非常薄的样品上，电子与样品中的原子碰撞而改变方向，从而产生立体角散射。散射角的大小与样品的密度、厚度相关，因此可以形成明暗不同的影像，影像将在放大、聚焦后在成像器件（如、胶片、以及）上显示出来。 由于电子的德布罗意波长非常短，透射电子显微镜的分辨率比光学显微镜高的很多，可以达到0.1～0.2 nm，放大倍数为几万～百万倍。因此，使用透射电子显微镜可以用于观察样品的精细结构，甚至可以用于观察仅仅一列原子的结构，比光学显微镜所能够观察到的最小的结构小数千倍。TEM在物理学和生物学等相关的许多科学领域中都是重要的分析方法，如、病毒学、材料科学、以及纳米技术、半导体研究等等。 在放大倍数较低的时候，TEM成像的对比度主要是由于材料不同的厚度和成分造成对电子的吸收不同而造成的。而当放大率倍数较高的时候，复杂的波动作用会造成成像的亮度的不同，因此需要专业知识来对所得到的像进行分析。通过使用TEM不同的模式，可以通过物质的化学特性、晶体方向、电子结构、样品造成的电子相移以及通常的对电子吸收对样品成像。 第一台TEM由和恩斯特·鲁斯卡在1931年研制，这个研究團隊于1933年研制了第一台分辨率超过可见光的TEM，而第一台商用TEM于1939年研制成功。 (zh) Трансмісійний електронний мікроскоп (Просвічуючий електронний мікроскоп, ТЕМ — TEM — англ. Transmission Electron Microscope) — вид електронного мікроскопа який дозволяє отримувати пряме зображення об'єкта за допомогою електронного променя. Техніка просвічення електронами (трансмісії) тонких об'єктів дозволяє отримувати розділення до 0,08 нм, а при використанні техніки електронного коректування аберації — ТЕАМ (Transmission Electron Aberration-corrected Microscope) отримувати розділення і 0,05 нм. (uk) |
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| dbp:date | December 2019 (en) |
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| rdfs:comment | Un microscopi electrònic de transmissió (TEM, per les seves sigles en anglès de Transmission Electron Microscope, o MET, en català) és un microscopi que utilitza un feix d'electrons per visualitzar un objecte. La potència amplificadora d'un microscopi òptic està limitada per la longitud d'ona de la llum visible. A causa que els electrons tenen una longitud d'ona molt menor que la de la llum visible, poden mostrar estructures molt més petites. Entre altres coses, s'utilitza en microbiologia, ja que permet observar l'estructura dels virus, i en nanoenginyeria. (ca) Die Transmissionselektronenmikroskopie (TEM, steht auch für Transmissionselektronenmikroskop) ist eine Betriebsart für Elektronenmikroskope, die eine direkte Abbildung von Objekten mithilfe von Elektronenstrahlen ermöglicht. In den 1930er-Jahren wurde erstmals das Auflösungsvermögen von optischen Mikroskopen durch die bahnbrechenden Arbeiten von Max Knoll und seinem damaligen Doktoranden Ernst Ruska überschritten. Letzterer wurde 1986 mit dem Nobelpreis für Physik ausgezeichnet. Die derzeitige Auflösungsgrenze liegt bei 0,045 nm. (de) Un microscopio electrónico de transmisión (TEM por su sigla en inglés, o MET en español) es un microscopio que utiliza un haz de electrones para visualizar un objeto, debido a que la potencia amplificadora de un microscopio óptico está limitada por la longitud de onda de la luz visible. Lo característico de este microscopio es el uso de una muestra ultrafina y que la imagen se obtenga de los electrones que atraviesan la muestra. Los microscopios electrónicos de transmisión pueden disminuir un objeto hasta un millón de veces. (es) Il microscopio elettronico a trasmissione, di solito indicato con l'acronimo TEM, dall'inglese transmission electron microscope, è un tipo di microscopio elettronico. (it) 透過型電子顕微鏡（とうかがたでんしけんびきょう、Transmission Electron Microscope; TEM）とは、電子顕微鏡の一種である。観察対象に電子線をあて、透過してきた電子線の強弱から観察対象内の電子透過率の空間分布を観察するタイプの電子顕微鏡のこと。また、電子の波動性を利用し、試料内での電子の回折 (電子回折) の結果生じる干渉像から観察対象物の構造を観察する場合もある。物理学、化学、工学、生物学、医学などで幅広く用いられている。 (ja) Transmisyjny mikroskop elektronowy (TEM, z ang. transmission electron microscope) – rejestrowane są elektrony przechodzące przez próbkę. Próbką w takim mikroskopie musi być cienka płytka o grubości rzędu setek nanometrów. Przygotowanie takiej próbki jest trudne i znacznie ogranicza zastosowania mikroskopu. (pl) Трансмісійний електронний мікроскоп (Просвічуючий електронний мікроскоп, ТЕМ — TEM — англ. Transmission Electron Microscope) — вид електронного мікроскопа який дозволяє отримувати пряме зображення об'єкта за допомогою електронного променя. Техніка просвічення електронами (трансмісії) тонких об'єктів дозволяє отримувати розділення до 0,08 нм, а при використанні техніки електронного коректування аберації — ТЕАМ (Transmission Electron Aberration-corrected Microscope) отримувати розділення і 0,05 нм. (uk) المجهر الإلكتروني النافذ (Transmission electron microscopy) والذي يرمز له اختصاراً TEM يعد المجهر الإلكتروني النافذ أداة قوية جدًا لعلوم المواد. تضيء حزمة عالية الطاقة من الإلكترونات عبر عينة رقيقة جدًا، ويمكن استخدام التفاعلات بين الإلكترونات والذرات لمراقبة ميزات مثل البنية البلورية والميزات في بنية مثل الخلع وحدود الحبوب. يمكن أيضا إجراء التحليل الكيميائي. يمكن استخدام TEM لدراسة نمو الطبقات وتكوينها وعيوبها في أشباه الموصلات. يمكن استخدام دقة عالية لتحليل نوعية وشكل وحجم وكثافة الآبار الكمومية والأسلاك والنقاط. (ar) Transmisní elektronový mikroskop (TEM) je elektronový mikroskop umožňující zobrazení a měření strukturních, chemických a mechanických vlastností látek až na atomární úrovni. Na rozdíl od světelného mikroskopu nevyužívá k pozorování viditelného světla ale urychlených elektronů. Na rozdíl od skenovacího elektronového mikroskopu (SEM), který primárně mapuje povrchu vzorku, TEM vzorek prosvěcí a přináší tak informaci z jeho objemu. Česká republika patří ke světové špičce jak ve výrobě elektronových mikroskopů, tak v oblasti související vědy a výzkumu. (cs) La microscopie électronique en transmission (MET, ou TEM pour Transmission Electron Microscopy) est une technique de microscopie où un faisceau d'électrons est « transmis » à travers un échantillon très mince. Les effets d'interaction entre les électrons et l'échantillon donnent naissance à une image, dont la résolution peut atteindre 0,08 nanomètre (voire 0,04 nm). Les images obtenues ne sont généralement pas explicites, et doivent être interprétées à l'aide d'un support théorique. L'intérêt principal de ce microscope est de pouvoir combiner cette grande résolution avec les informations de l'espace de Fourier, c'est-à-dire la diffraction. Il est aussi possible d'identifier la composition chimique de l'échantillon en étudiant le rayonnement X provoqué par le faisceau électronique. Contrair (fr) Mikroskop transmisi elektron (bahasa Inggris: Transmission electron microscopy, disingkat TEM) adalah teknik mikroskop di mana berkas elektron ditransmisikan melalui spesimen untuk membentuk gambar. Spesimen paling sering merupakan bagian yang sangat tipis dengan tebal kurang dari 100 nm atau suspensi pada bingkai. Sebuah gambar terbentuk dari interaksi elektron dengan sampel saat berkas ditransmisikan melalui benda uji. Gambar kemudian diperbesar dan difokuskan ke perangkat pencitraan, seperti layar fluoresen, lapisan film gulung, atau sensor seperti kilau yang dipasang ke peranti tergandeng-muatan. (in) Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device. (en) Um microscópio eletrônico de transmissão (português brasileiro) ou microscópio eletrónico de transmissão (português europeu) (MET) é um microscópio no qual um feixe de elétrons é emitido em direção a uma amostra ultra fina, interagindo com a amostra enquanto a atravessa. A interação dos elétrons transmitidos através da amostra forma uma imagem que é ampliada e focada em um dispositivo de imagem, como uma tela fluorescente em uma camada de filme fotográfico, ou detectada por um sensor como uma câmera CCD. (pt) Просве́чивающий (трансмиссио́нный) электро́нный микроско́п (ПЭМ, англ, TEM — Transmission electron microscopy) — устройство для получения изображения с помощью проходящего через образец пучка электронов. Так как поток электронов сильно поглощается веществом, изучаемые образцы должны иметь очень маленькую толщину, так называемые ультратонкие образцы. Ультратонким считается образец толщиной менее 0,1 мкм. (ru) 透射电子显微镜（英語：Transmission electron microscope，縮寫：TEM、CTEM），简称透射电镜，是把经加速和聚集的电子束投射到非常薄的样品上，电子与样品中的原子碰撞而改变方向，从而产生立体角散射。散射角的大小与样品的密度、厚度相关，因此可以形成明暗不同的影像，影像将在放大、聚焦后在成像器件（如、胶片、以及）上显示出来。 由于电子的德布罗意波长非常短，透射电子显微镜的分辨率比光学显微镜高的很多，可以达到0.1～0.2 nm，放大倍数为几万～百万倍。因此，使用透射电子显微镜可以用于观察样品的精细结构，甚至可以用于观察仅仅一列原子的结构，比光学显微镜所能够观察到的最小的结构小数千倍。TEM在物理学和生物学等相关的许多科学领域中都是重要的分析方法，如、病毒学、材料科学、以及纳米技术、半导体研究等等。 在放大倍数较低的时候，TEM成像的对比度主要是由于材料不同的厚度和成分造成对电子的吸收不同而造成的。而当放大率倍数较高的时候，复杂的波动作用会造成成像的亮度的不同，因此需要专业知识来对所得到的像进行分析。通过使用TEM不同的模式，可以通过物质的化学特性、晶体方向、电子结构、样品造成的电子相移以及通常的对电子吸收对样品成像。 (zh) |
| rdfs:label | مجهر إلكتروني نافذ (ar) Microscopi electrònic de transmissió (ca) Transmisní elektronový mikroskop (cs) Transmissionselektronenmikroskop (de) Microscopio electrónico de transmisión (es) Mikroskop transmisi elektron (in) Microscopio elettronico a trasmissione (it) Microscopie électronique en transmission (fr) 透過型電子顕微鏡 (ja) Transmisyjny mikroskop elektronowy (pl) Microscópio eletrônico de transmissão (pt) Просвечивающий электронный микроскоп (ru) Transmission electron microscopy (en) Трансмісійний електронний мікроскоп (uk) 透射电子显微镜 (zh) |
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| is dbp:knownFor of | dbr:Frances_M._Ross |
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