Integrated Circuit Design Research Papers (original) (raw)

Miniaturization reduces package size, cost and board space. System on Chip (SoC) integrates a system on a common silicon substrate, however there are some shortcomings with this approach such as high manufacturing cost. Handling of... more

Miniaturization reduces package size, cost and board space. System on Chip (SoC) integrates a system on a common silicon substrate, however there are some shortcomings with this approach such as high manufacturing cost. Handling of different levels of voltage and current on a common silicon substrate with controller IC operating in the range of several volts and milliamps, while power

As SoC complexity grows new methodologies and tools for system design and time-effective ditsign space exploration are required. In this paper we introduce a tool called CASSE, what stands for Camellia system-on-chip simulation... more

As SoC complexity grows new methodologies and tools for system design and time-effective ditsign space exploration are required. In this paper we introduce a tool called CASSE, what stands for Camellia system-on-chip simulation environment. CASSE is a fast, flexible, and modular SystemC-based simulation environment which aims to be useful for design-space exploration and system-level design at different abstraction levels. The tool uses transaction-level modeling techniques for fast simulations and easy architectural modeling, and bridge the gap to system implementation by a progressive refinement approach. CASSE is being used in the European 1ST-2001-34410 CAMELLIA project, which focuses on the mapping of innovative smart imaging applications onto an existing video encoding architecture.

Wireless biosensor applications require RF electronics to operate in immediate proximity of the body. This work investigates the effect of human body on RF circuits by simulations and measurements. Design methodology and initial design... more

Wireless biosensor applications require RF electronics to operate in immediate proximity of the body. This work investigates the effect of human body on RF circuits by simulations and measurements. Design methodology and initial design guidelines for body-worn discrete RF electronics are presented. The test structures are manufactured using printed electronics technology well suited for thin, flexible body-worn wireless sensor applications. The results indicate that in direct contact the human body significantly affects the performance of an RF circuit and needs to be considered. The research is relevant for modeling-based design of flexible body-worn wireless sensors.

A Dedicated Memory Controller is of prime importance in applications that do not contain microprocessors (high-end applications). The Memory Controller provides command signals for memory refresh, read and write operation and... more

A Dedicated Memory Controller is of prime importance in applications that do not contain microprocessors (high-end applications). The Memory Controller provides command signals for memory refresh, read and write operation and initialization of SDRAM. Our work will focus on ASIC Design methodology of Double Data Rate (DDR) SDRAM Controller that is located between the DDR SDRAM and Bus Master. The Controller simplifies the SDRAM command interface to standard system read/write interface and also optimizes the access time of read/write cycle. Double Data Rate (DDR) SDRAM Controller is implemented using Cadence RTL Compiler.

Design-for-testability (DFT) is widely used in current integrated circuit design to enhance the controllability and observability of signals. The technologies insert extra logics into an original design, running in test mode without any... more

Design-for-testability (DFT) is widely used in current integrated circuit design to enhance the controllability and observability of signals. The technologies insert extra logics into an original design, running in test mode without any functional influence. How to make all the test logics work harmoniously and obtain high fault coverage with low area and performance overhead are the two main issues of DFT. Based on the design of a general-purposed CPU chip, this paper introduces some advanced topics to conquer the problems, including technologies of memory built-in-self-test (BIST), internal scan design, logic BIST, IEEE Std. 1149.1 (JTAG)-compatible boundary scan design and the correlations among them. These technologies offer a convenient and reliable DFT scheme for digital circuit designs, especially for large-scale ones, like a general-purpose CPU chip.

Geometric programming (GP) has been employed in automatic design of analog integrated circuits. Its major advantage is the ability to find the globally optimum solution to a problem. It however, suffers from dependency on the accuracy of... more

Geometric programming (GP) has been employed in automatic design of analog integrated circuits. Its major advantage is the ability to find the globally optimum solution to a problem. It however, suffers from dependency on the accuracy of the initial equations and the parameters used in these equations. This, in circuit design, causes discrepancies between GP predictions and simulation results-especially in sub-micron devices-thus resulting in a non-globally optimum circuit design. In this paper, two major sources of this discrepancy are introduced and resolved by an iterative simulation-equation-based design methodology based on GP for operational amplifiers. In order to show the effectiveness of the methodology, it has been applied to two op-amp architectures.

The sensitivity of application specific integrated circuits (ASICs) to the single event effects (SEE) can induce failures of the systems which are exposed to increased radiation levels in the space and on the ground. This paper presents a... more

The sensitivity of application specific integrated circuits (ASICs) to the single event effects (SEE) can induce failures of the systems which are exposed to increased radiation levels in the space and on the ground. This paper presents a design methodology for a full fault tolerant ASIC that is immune to the single event upsets (SEU) in sequential logic, the single event transients (SET) in combinational logic and the single event latchup (SEL). The dual modular redundancy (DMR) and a SEL power-switch (SPS) are the basis for a modified ASIC design flow. Measurement results have proven the correct functionality of DMR and SPS circuits, as well as a high fault tolerance of implemented ASICs along with moderate overhead in respect of power consumption and occupied silicon area.